Jupiter XR Large-Sample AFM from Asylum Research

Oxford Instruments Asylum Research AFMs are widely used by both academic and industrial researchers

for characterizing samples from

diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topogra- phy and roughness, Asylum Research AFMs also

offer unmatched resolution and quantitative measurement capa- bility for nanoelectrical, nanomechanical, and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity.

Oxford Instruments America, Inc.

Bruker Launches New High-Speed AFM System for Life Science Microscopy Applications

Bruker announced the release of the JPK NanoWizard® ULTRA Speed 2 advanced AFM system, which combines highest-speed and highest-resolution AFM with advanced bio-imaging features. Te system is the first

new product to come out of Bruker’s JPK BioAFM business, formed in July 2018 with the acquisition of JPK Instruments AG. Te JPK NanoWizard ULTRA Speed 2 comes standard with PeakForce Tapping®.

Bruker Corporation

Modular Turnkey Systems Add Spectroscopy to Any Microscope

HORIBA Scientific introduces its new Standard Microscope Spectroscopy (SMS) system. With its unique set of accessories, the SMS family of systems enables any standard microscope to be fitted with a spectrometer and a detector, thereby offering the ability to perform techniques such as

Raman, steady state, and time-resolved photoluminescence, reflectance/ transmittance, electroluminescence, photocurrent, and dark field scattering. Te SMS platform brings unprecedented flexibility and modularity to performing spectroscopy on standard microscope systems.

HORIBA Scientific

Prior Scientific Introduces the PureFocus 850

Prior Scientific announced the new PureFocus 850, an autofocus microscope. Te PureFocus 850 is a fast, precise, and accurate


The TESCAN S9000G is a gallium FIB- SEM system aimed at advanced ultra- thin TEM sample preparation. The instrument features the Triglav™ SEM column for ultra-high resolution with excellent performance, especially at low

electron beam energies, and improved in-beam detection system with filtering electron signal collection capabilities. It is equipped with the Orage™ FIB column that delivers not only the highest standard in precision for nanofabrication, but also the possibility to use high ion beam currents, making it feasible to conduct large- volume sample analyses.


High Power, UV LED Light Engines

Innovations in Optics, Inc. offers LumiBright™ UV-LED Light Engines, powerful solid-state sources that are being used within OEM equipment applied to photocuring of adhesives and

coatings, as well as photomask exposure systems for photolithography. LumiBright™ UV-LED Light Engines feature UV die arrays bonded on MCPCB substrates that enhance thermal performance for high-current density operation. Te specialized primary optic is a non-imaging concentrator made from fused silica, ideal for high-power UV flux.

Innovations in Optics, Inc.

ZEISS Introduces Next Generation X-Ray Microscopes

ZEISS introduced two new advanced models of the ZEISS Xradia Versa family: Te ZEISS Xradia 610 and 620 Versa X-ray microscopes. Tey excel through faster non-destructive imaging of intact samples without sacrificing resolution and contrast over the full range of power and kV.

Researchers and scientists across the world rely on the signature resolution at a distance (RaaD) capability of ZEISS Xradia Versa microscopes.

ZEISS Research Microscopy Solutions

Microflow III Class 1 Ductless Workstation focusing system that has been

designed to fit both upright and inverted microscopes using infinity corrected optics.

Te PureFocus 850 is able to precisely and consistently focus on samples. It is the only system to reliably focus on slides, well plates, chamber slides, and Petri dishes while maintaining clear images for long-term studies.

Prior Scientific

2019 May •

Te MicroFlow III is a Class 1 ductless carbon- filtered workstation equipped with particle pre-filter and Activated Carbon filtration ideal for fumes, odors, and non-hazardous chemical vapors. It is self-contained with integral recessed work surface to contain spills. A convenient clear viewing sash surrounds the work area for user protection. Te sash can be conformed for use with a microscope and is easily removable. Variable-

speed fan control allows for high-speed 100f/m. air flow through the sash opening.

HEMCO Corporation


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