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Volume 25


Number 4 August 2017


preview of some upcoming articles


Nitrogen Gas Field Ion Source (GFIS) Focused Ion Beam (FIB) Secondary Electron Imaging: A First Look Marek E. Schmidt, Anto Yasaka, Masashi Akabori, and Hiroshi Mizuta


A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation Paul E. Fischione, Robert E.A. Williams, Arda Genç, Hamish L. Fraser, Rafal E. Dunin-Borkowski, Martina Luysberg, Cecile S. Bonifacio, and András Kovács


T e Conjunctiva-Associated Lymphoid Tissue in Chronic Ocular Surface Diseases Rodolfo Mastropasqua, Luca Agnifi li, Vincenzo Fasanella, Mario Nubile, Agbeanda A. Gnama, Gennaro Falconio, Paolo Perri, Silvio Di Staso, and Cesare Mariotti


Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers Joshua A. Taillon, Valery Ray, and Lourdes G. Salamanca-Riba


A Comprehensive Approach Towards Optimizing the Xenon Plasma Focused Ion Beam Instrument for Semiconductor Failure Analysis Applications Srinivas Subramaniam, Jennifer Huening, John Richards, and Kevin Johnson


Automated Image Acquisition for Low-Dose STEM at Atomic Resolution Andreas Mittelberger, Christian Kramberger, Christoph Hofer, Clemens Mangler, and Jannik C. Meyer


Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System- based Transmission Electron Microscopy Heating Experiments Sriram Vijayan, Joerg R. Jinschek, Stephan Kujawa, Jens Greiser, and Mark Aindow


Protective Eff ects of Coenzyme Q10 on Developmental Competence of Porcine Early Embryos Shuang Liang, Ying Jie Niu, Kyung-Tae Shin, and Xiang-Shun Cui


Swiss Stained-Glass Panels: An Analytical Study Andreia Machado, Sophie Wolf, Luis C. Alves, Ildiko Katona-Serneels, Vincent Serneels, Stefan Trümpler, and Márcia Vilarigues


Histomorphometric Parameters of the Growth Plate and Trabecular Bone in Wild-Type and Trefoil Factor Family 3 (Tff 3)-Defi cient Mice Analyzed by Free and Open-Source Image Processing Soſt ware Nikola Bijelić, Tatjana Belovari, Dunja Stolnik, Ivana Lovrić, and Mirela Baus Lončar


Atomic Scale Structural Characterization of Epitaxial (Cd,Cr)Te Magnetic Semiconductor Bastien Bonef, Hervé Boukari, Adeline Grenier, Isabelle Mouton, Pierre-Henri Jouneau, Hidekazu Kinjo, and Shinji Kuroda


T e Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging Gregory L. Fisher, John S. Hammond, Scott R. Bryan, Paul E. Larson, and Ron M. A. Heeren


Quantifi cation of Cardiomyocyte Alignment from T ree-Dimensional (3D) Confocal Microscopy of Engineered Tissue William J. Kowalski, Fangping Yuan, Takeichiro Nakane, Hidetoshi Masumoto, Marc Dwenger, Fei Ye, Joseph P. Tinney, and Bradley B. Keller


Precipitation of (Si2 − xAlx)Hf in an Al–Si–Mg–Hf Alloy Xueli Wang, Zhiqiang Xie, Huilan Huang, Zhihong Jia, Guang Yang, Lin Gu, and Qing Liu


Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM) Ryan J. Wu, Anudha Mittal, Michael L. Odlyzko, and K. A. Mkhoyan


Design and Fabrication of a T ree-Dimensional in Vitro System for Modeling Vascular Stenosis Rebecca S. Jones, Pin Hsuan Chang, Tzlil Perahia, Katrina A. Harmon, Lorain Junor, Michael J. Yost, Daping Fan, John F. Eberth, and Richard L. Goodwin


2017 July • www.microscopy-today.com Dear Abbe, I need to get high-resolution images of our samples on


a fi eld emission SEM. Our problem is the EM Lab we use is primarily materials-based, but our samples are of Turtle Herpes virus and Rabbit Pox. T ey say they can’t help us. Why are they being so obstinate? Blocked at Berkeley


Dear Blocked,


Freund, quit your whining! You’re lucky the EM techs talked to you at all! Your particular samples sound like they were derived from a disease scenario of Alice’s Adventures in Wonderland . It’s particularly sad since my friend, Charles Dodgson (you may know him as Lewis Carroll), was a good mathematician and logician who would be upset to see what you’ve done to his characters! In physical science circles your samples would be referred to as “squishies” that could potentially contaminate their high-end analytical microscope. But honestly, this is just an excuse. Your Kollegen are really just insecure. T ey always look at nice, simple things like a crystal or a nanoparticle. When they see your viri, they don’t want to be reminded of how simple their subjects are. So they melodra- matically cry “contamination!” like the boy that cried wolf. It is best if you don’t get your knickers in a bunch and instead go fi nd others of your kind that enjoy a good tea party with other Mad Hatters.


Dear Abbe,


We have a very strange microscopy problem. Based on your expertise I hope that you have some suggestions for the cause of the problem. Currently we are trying to do wide-fi eld imaging of endogenous fl uorophores (NADH, FAD). For this, we use a 365/50 nm excitation fi lter and a 480/30 nm emission bandpass. When we try to do multi-position imaging (automated stage controlled by an old Optiscan controller), we observe a strange sinewave-like modulation in the signal (but only with the mentioned UV excitation fi lter set) that has an amplitude of approximately 10–15% of the initial signal. Cycle time for the sinusoidal artifact is approximately 10–15 min. T is artifact only appears when the stage is actually in use (single-position imaging yields a stable signal). T e whole setup is driven by the most recent controller soſt ware release, which is (except for the observed perturbation) working just fi ne. Do you have any idea on how to tackle the problem? Anxious in Essen


Dear Anxious, Your scope is broken.


Instrumentation woes and broken relationships are just a few of the topics within Herr Abbe’s experiential spectrum. Send whatever vexes you have to his assistant at JPShields@uga.edu .


doi: 10.1017/S1551929517000542 73


Dear Abbe


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