Full Information Acquisition
Table 1 : Key imaging and spectroscopy modes in scanning probe microscopy (SPM).
Scanning Probe Microscopy Mode
Topographic Imaging
Target Materials / Systems All materials and systems
Significance
Enabling technique of nanoscience, realized on >50,000 microscope platforms worldwide
AFM: ~>80,000 papers with > 1,000,000 citations on Web of Science (ISI)
Information Provided
Measures surface topography with ~0.1 nm vertical and ~3 nm lateral resolution (contact mode)
Atomic and molecular level resolution possible
Works in an ambient and controlled atmosphere, in liquids, and in vacuum
Phase image (or dissipation) provides information on material composition
Signal recorded on fi xed spatial grid
Magnetic Force Microscopy Magnetic materials
Mainstream tool for magnetic device characterization ~2,800 papers with ~40,000 citations on ISI
Measures frequency shiſt and quality factor
Semi-quantitative due to complexity of tip magnetic structure
Sensitive to convolution with stray electrical contrast
Visualization of static magnetic domains with 10–30 nm resolution
Kelvin Probe Force Microscopy
Semiconductor devices Photovoltaics Ferroelectrics Energy materials Molecular systems
Piezoresponse Force / Electrochemical Strain Microscopy
Ferroelectrics Piezoelectrics Biological systems Memristors Energy storage and conversion materials
Force Spectroscopy
Polymer systems Biological systems Single molecules Colloidal solutions
Current-Voltage Mapping
Conductors Semiconductors Single molecules
Mainstream technique for probing electric phenomena on nanometer and atomic level
~1,200 papers with ~18,000 citations on ISI. Developing very rapidly since the past 5 years
Enabling technique for probing polarization dynamics and ionic transport on the nanoscale
PFM: ~1,200 papers with ~19,000 citations; ESM: ~50 papers with ~650 citations on ISI
Enabling tool for single- molecule biology, chemistry, and nanomechanics
Measures contact potential diff erence, well defi ned only for linear dielectric materials
Not suitable in liquids or electrochemical systems
Measurement is static ~10 ms per pixel, no information on local dynamics
Measures electromechanical response of the surface and dissipation
Large number of spectro- scopic modes for probing polarization switching
Probes local mechanical properties
Provides the structure of double layers and solvation layers in liquids
Single molecule reactions
Mainstream technique for probing electronic transport properties of samples.
Correlation of electronic phenomena with topographical features such as grain and phase boundaries
Measurement of local density of states, quasi particle scattering, superconducting gaps
2017 July •
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