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70 mm2


and 25 mm2 for


FAST SDD® EDS (SEM) Applications


PELCO Silicon Nitride ®





Robust and clean 8, 15, 50 and 200nm SiN substrates


50 tes


Amptek’s new FAST SDD® detectors for EDS use with SEMs utilize "C2 Series" X-ray windows (Si3


N4 sponse.


EDXA and EDXMA. 300,000


50,000 100,000 150,000 200,000 250,000


0 0 100 ®


Beryllium Kα 100 eV energy


39.0 eV FWHM Carbon Kα


277 eV energy 45.2 eV FWHM


200 Energy (keV) 300 400 500 600


TED PELLA, INC. Microscopy Products for Science and Industry


www.amptek.com www.tedpella.com sales@tedpella.com 800.237.3526


Holey SiN Substrates


Silicon Dioxide Substrates


) and have excellent low energy re- Its high intrinsic efficiency makes it ideal for EDX, XEDS,


 Ø3.0mm frame 





EasyGrip™edges  Free from debris


Super flat 8, 15, and 40nm silicon dioxide substrates


es m


& Silicon Dioxide Membranes Next Generation SiN TEM Support Films


New!


COUNTS


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