PRODUCTS TEST & MEASUREMENT TDR SPEEDS UP
FAULT LOCATION A new time domain reflectometer (TDR), designed specifically to meet the needs of DNOs to speed up the location of faults on live or dead LV networks, has been added to Megger’s TDR2000 range. The instrument has a built-in 600V input protection filter suitable for CAT IV 600V applications, an intuitive user interface and a tagging facility where users can add a name to saved traces. Additional features include an AutoFind function to take users quickly to the fault, while an automatic FindEnd function enables fast cable length measurements. According to the company, the dead
zone effect of a standard pulse TDR can mask near-end faults and make them undetectable, however the inclusion of a
COIL CLAMP METERS FOR EASY INSPECTION
Enabling electricians to take accurate measurements in tight, awkward spots, FLIR’s CM55/57 Flexible Clamp Meters and TA72/74 Universal Flex Current Probe Accessories can easily snake around obstacles to achieve the most accurate measurements and readings, adding up to 3000A AC current for multiple conductor measurements. Both are available in 10” or 18” flexible coil lengths. Lightweight yet capable of withstanding a 3m drop, these also
provide bright, dual LED work lights for illumination when taking readings in poorly lit locations and in deep, crowded cabinets. Additional features of the clamp meters include Bluetooth
communication for remote viewing and data transfer to iOS and Android devices via the FLIR Tools mobile app. Users can also connect multiple units wirelessly for remote viewing of multiphase systems. The probe accessories are equipped with a standard banana plug and voltage signal output, making them compatible with DMMs and clamp meters of any brand.
FLIR Systems T: 01732 220011
CABLE ASSEMBLIES FOR VNA TESTING LAUNCHED
Test and measurement products from Nanjing Arance Electronics, including the NAC series of cable assemblies, are now available from Aspen Electronics. According to the company, the NAC series of flexible test
step function eliminates this problem. With step TDR technology the signal is injected at full strength and stays there until a disturbance is detected, making it suitable for detecting near end faults. In addition, its distance-dependent
gain function eliminates the drop off of signal due to attenuation on longer lines by gradually increasing the gain applied to the return signal. This allows a more even representation of the relative attenuation at all points along the trace. As with other instruments in the range,
the TDR has a minimum resolution of 0.1m/0.3ft combined with maximum range of up to 20km/60kft, depending on the velocity factor selected and the cable type.
Megger
assemblies have a rugged, lightweight construction. These low-loss precision test cables offer VSWR and phase/flexure stability and are ideal for precise measurements, with stable electrical performance up to 67GHz. Fitted with NMD connectors they are primarily designed for use with high frequency microwave Vector Network Analysers (VNA) where they are said to maintain excellent electrical characteristics under laboratory and production conditions. In addition, the reinforced sheath test cables exhibit torque and crush resistance. These have been designed for test equipment applications
where test ports will be continually mated and re-mated. They are available as sets containing two cables with 60cm standard length each and can be operated at 0 to +40˚C.
www.megger.com Aspen Electronics
www.aspen-electronics.com HIGH PERFORMANCE PXIE MULTIPORT VNA
New from Keysight Technologies is the M9485A VNA, a high performance PXIe multiport vector network analyser designed for high-volume wireless component manufacturing of the front-end modules, switches and filters used in mobile phones and base stations. Its true multiport architecture provides fast measurement speeds while maintaining high dynamic
range; and frequency coverage of 1MHz to 9GHz is suitable for future component designs. According to the company, its multiport capability of up to 24 ports means all receivers synchronize with a common source to measure all S-parameters at once. When measuring multiport devices, this configuration reduces the sweep time compared to a switch matrix-based solution. The M9485A provides a fast speed (5msec at 201 points with 2-port calibration) and wide dynamic
range (up to 142 dB dynamic range). It also delivers low trace noise (0.001-dBrms at 10 kHz IFBW) and high stability (0.005 dB/˚C).
Keysight 30 OCTOBER 2015 | INSTRUMENTATION
www.keysight.com
www.flir.com
CHANNEL FADING ADDED TO TESTER
Channel fading simulation has been integrated into Anritsu Corporation’s 4G LTE-Advanced Signalling Tester. The digital baseband fading options convert the MD8430A into a full-featured fading simulator supporting industry standard 3GPP-defined fading profiles. According to the company, this is the
first LTE-Advanced signalling solution with built-in fading supporting the 4x4 MIMO downlink configuration. Tall structures, such as buildings and trees, reflect and scatter transmitted radio waves, meaning the receiver actually receives multiple original signals arriving from ‘multipaths’ with different strengths, times and directions. A key feature of LTE-Advanced is the Multiple Input Multiple Output (MIMO) antenna system that improves device performance by exploiting multipaths. To test such MIMO devices thoroughly, multipath fading effects must be applied accurately to every antenna in a reproducible manner. Using internal digital baseband
processing, the tester applies multipath effects during test execution, and the Rapid Test Designer (RTD) software provides an integrated environment for creating and running fading simulation tests. Support for LTE-Advanced features, such as Carrier Aggregation and MIMO, mean the MD8430A will help chipset designers build the next generation of mobile devices.
Anritsu
www.anritsu.com
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