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XRF Feature


New High-performance, Direct Excitation Variable Spot EDXRF Elemental Analyser Launched


Applied Rigaku Technologies, Inc. (USA) has announced its launch of the new Rigaku NEX DE VS direct excitation variable spot X-ray fluorescence (EDXRF) elemental analyser. The NEX DE VS analyser is the newest addition to the Rigaku NEX DE Series of high-performance, direct excitation EDXRF elemental analysers.


Each instrument in the NEX DE series is equipped with a 60 kV, 12 W X-ray tube and a high-throughput Si drift detector. This detector supports count rates in excess of 500K cps, resulting in low limits of detection. The instruments were designed for demanding applications or for situations where analysis time or sample throughput is critical, and is suitable for a broad range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications.


The NEX DE VS analyser is uniquely suited for small spot analysis applications. It features a high resolution camera combined with automated collimators allowing for precise positioning of a sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes. These features, combined with the advanced Rigaku QuantEZ analytical software, provide unparalleled performance for both bulk and small spot analysis in a single instrument.


A New Hero for Reliable Hot Sample XRF analysis


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Oxford Instruments (UK) has launched a unique solution for reliable X-ray fluorescence (XRF) analysis of hot samples, for use with their range of X-MET8000 series handheld XRF analysers. The HERO™ heat resistant protective window allows hot samples of up to 400ºC to be directly analysed for alloying elements including light elements such as silicon.


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Positive Material Identification (PMI) inspection sometimes requires the testing of in-service components such as pipes, reaction vessels, etc. that are at high temperatures. When testing hot samples using the X-MET8000, the operator simply swaps the analyser’s normal Prolene® window for the HERO heat resistant window. Unlike other solutions available, there is no need for special spacers, shields or tilting techniques, which may have a detrimental effect on the accuracy of the results, especially for light elements. The use of the new window allows the operator to carry out in-service testing, therefore minimising downtime.


Christelle Petiot, Product Manager, Oxford Instruments, said: “This unique solution truly simplifies the task for operators wanting to test in-service, high temperature components, whilst retaining the analyser’s excellent performance. Unlike other solutions currently on the market, there is no need for additional accessories or special measuring techniques that may cause results to vary from one user to another. With the use of the HERO window, operators also retain the capability of measuring light elements, which is critical in the testing of low alloy steels and other alloys.”


The X-MET8000 series of field portable analysers are fitted with a large-area silicon drift detector (SDD) and high performance X-ray tube, delivering the exceptional speed and superior performance needed for the measurement of trace alloying elements. The X-MET8000 is manufactured with a rugged enclosure and its IP54 rating ensures durability and low cost of ownership making it ideal for use outside. Its large heat sink provides the most efficient heat dissipation ensuring stability and reliability, even in hot environments. Compact and lightweight at only 1.5kg including the battery, the X-MET8000 is fully portable for true on-site analysis.


The X-MET8000 range comprises three models of analysers designed to cover all analysis needs and budgets. The entry level, X-MET8000 Smart analyser is ideal for the routine identification and analysis of common alloys. The mid-range X-MET8000 Optimum model is optimised for high speed grade identification and analysis, from aluminiums to high temperature alloys, to steels etc. The top of the range X-MET8000 Expert provides the ultimate performance for the testing of the widest variety of alloys; with superior light elements (Mg, Al, Si, P and S), tramp and residual elements analysis.


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39337pr@reply-direct.com Why the S8 TIGER? 38352pr@reply-direct.com


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An XRF Safari in Africa


Due to the success of their March 2016 course, Wirsam Scientific (South Africa) and Precision Equipment (Pty) Ltd. will be hosting another X-ray Fluorescence Spectrometry training course to be held in Johannesburg, South Africa from the 5th to 9th September 2016.


This is the perfect opportunity to improve your knowledge on XRF and combine it with a getaway to South Africa’s most loved game reserves and tourist attractions.


The focus and content will be vendor neutral, and users of all makes of XRF equipment will find it both informative and useful.


Lectures and practical sessions will primarily be given by renowned speaker and authors Emeritus Prof James Willis and Dr Clive Feather, amongst other experts, on the theory and practice of both wavelength, energy dispersive XRF spectrometry and sample preparation.


The course is divided into two distinct parts – XRF theory and practical XRF.


The theory section covers: radiation safety; X-ray physics; WDXRF spectrometer components and selection of analytical conditions; XRF sample preparation (primary preparation, pressed powders, fused beads, metals, liquids and special samples); X-ray statistics; mass absorption coefficient theory; XRF calibration theory; EDXRF spectrometers; XRF quality control; an introduction to “standardless” analytical methods; fault finding tools; trouble shooting; XRF maintenance; and XRF laboratory services and environment requirements.


The practical section covers: hands-on sample preparation of pressed powders and fused beads; selecting instrument conditions, qualitative analysis (XRF spectra) and quantitative analysis using WDXRF and EDXRF of samples prepared by participants; calibrations and analysis of “unknowns” for both major elements (using fusion beads) and trace elements (using pressed powders) by WDXRF and EDXRF; a practical demonstration of EDXRF semi-quantitative analysis, the use of drift monitors, correction for background and spectral overlap, and different methods of correction for inter- element matrix effects (absorption and enhancement).


The emphasis will be on the application of WDXRF and EDXRF to geological materials, but applications in the cement, metals and other industries and in environmental analysis will also be discussed. XRF calibration and trouble-shooting workshops are also included.


Wirsam Scientific can arrange a package that includes a 5-day course, accommodation, transfers, tours and safari. 39289pr@reply-direct.com


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REASON #23: Quality components


Core technologies, including X-ray generator, goniometer, X-ray detector and analyzer crystals, have been developed by Bruker, specifi cally for use in the S8 TIGER WDXRF.


www.bruker.com/S8TIGER-23


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JUNE / JULY • WWW.PETRO-ONLINE.COM


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WDXRF


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QUALITY COMPONENTS


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