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Environmental Analysis
Affordable Handheld XRF Alloy Analyser CHICAGO, Illinois -- March 9, 2009 – At Pittcon®
2009, Bruker AXS (Germany) introduces the S1 SORTER as a rugged, easy-to-use and affordable handheld XRF
alloy analyser, which provides true point-and-shoot alloy identification and elemental composition. The S1 SORTER was designed primarily for common alloys in the steel, cobalt, nickel, copper and titanium families. Its standard empirical calibrations provide fast and accurate analysis of these alloys while the optional Fundamental Parameters (FP) calibration allows the analysis of more exotic alloys. The S1 SORTER provides a large grade library for alloy ID along with the capabilities to store and transfer the data for report generation.
Dr. John Patterson, Bruker’s Director of Marketing & Product Management for handheld XRF, explained: “The S1 SORTER was designed to meet the basic needs of the market for a rugged analyser, which provides truly point-and-shoot analysis at a very attractive price point. In the business-critical area of handheld XRF technology, Bruker aims not only to be the best, but also to deliver the best value.
Reader Reply Card no 189
New Air velocity Transmitter for 0.2 to 20m/s (40 to 4000 ft/min)
The new miniature air velocity transmitters, series EE575 and EE576 of E+E Elektronik (Austria), allow accurate measurements of flow in air and gases. The EE575 measures velocities up to 20 m/s (4000 ft/min). The EE576 is specifically designed for the measurement of low flows up to 2 m/s (400 ft/min).
Applications for these transmitters are found in HVAC systems, handling and controls for intake and exhaust of air and laminar flow monitoring. Equipped with a newly developed sensor head and utilising the proven E+E hot-film element, already tested a million times in the automotive industry, these transmitters are less sensitive to dust and dirt than conventional hot-wire elements.
The design with a probe length of 150 mm (6 inch) and the integrated electronics can be considered very compact. This allows for the use in applications where mounting space is limited. The alignment strip along the side of the probe and the matching mounting flange secures the positioning of the sensor and the immersion depth of the probe is infinitely variable. That saves time and prevents incorrect installation.
The series can be supplied in the range of 10-29 Vdc and provides standardised linear output signals of 0-5V or
0-10V. With a temperature range of -20....60 °C (-4....140 °F) and the electrical connection through a 0.5m (1.5 ft) or 2m (6 ft) long fixed cable, the series EE575 and EE576 ensures highest application- and mounting-flexibility.
Reader Reply Card no 190 A+ Single Element Standards
The VHG Labs (USA) A+ Single Element Calibration Standards are designed for use for ICP-MS, ICP-AES, AA and other spectrometric techniques. These high purity standards are unique in that they are assayed in accordance with the High Performance ICP (HP-ICP-AES) method that was developed by NIST.
The HP-ICP-AES method ensures the highest accuracy standards available, which translates into better analytical results. Both the certified concentration and the uncertainty associated with it are directly traceable to the appropriate NIST SRM through an unbroken chain of measurements. A Certificate of Analysis that documents the traceability to NIST and also reports trace impurity levels accompanies each A+ Standard. VHG also offers consumables and supplies for ICP, AA, ICP-MS, GFAA and XRF.
Reader Reply Card no 195 Reader Reply Card no 191 Methyl MercuryAutomatedAnalysis Too Many Lines, Not Enough Time? CLIP can Help You! MDL <0.002 ng/L
• Superior CVAFS Hg detector • Unmatched analytical performance • Built-in programmable GC oven • Excellent, user-friendly software • Fully programmable analysis cycle • Short set up time • Free factory training • Lifetime technical support
Tekran® Series 2700 Automated CVAFS Methyl Mercury Analyzer
Waters and Industrial Effluent Automated EPA Method 1630
Sediments and Biota Automated analysis of prepared samples
www.tekran.com
lab-air-info@tekran.com
330 Nantucket Boulevard,Toronto, Canada M1P 2P4 Tel: +1 416 449 3084 Fax: +1 416 449 9298 Toll Free (US & Canada) +1-888-583-5726
Fully Automatic Sample Preparation for Ion Chromatography
Complex matrices carrying organic loads such as wastewater, soil eluates or dairy products pose a challenge to ion chromatography as they make direct analysis of samples impossible. Hence, thorough sample preparation steps are a must. If carried out manually, these sample preparation steps are both time-consuming and error prone.
Metrohm’s (Switzerland) Inline Sample Preparation (MISP) provides an elegant answer sparing users from manual sample preparation. MISP stands for a range of methods that allow users to fully automate the preparation of difficult samples thus saving a great deal on time and money while improving the accuracy of their analyses.
Reader Reply Card no 194 Reader Reply Card no 193
In ICP-AES, line-rich spectra are often observed and it is difficult to find analyte lines free of interference from all the matrix or concomitant element lines. This is especially true with matrices such as steel, tungsten, zirconium, precious metals and other complex matrices.
Usually the analyst prepares known solutions, makes profiles for each wavelength at different concentrations of the analyte and concomitant elements and finally selects a line free of interference with adequate sensitivity. This crucial step in method development is long and tedious. It must be conducted with great care because it can greatly influence the accuracy of the results.
HORIBA Jobin Yvon (France) simplifies this step with CLIP (Collection of Line Intensity Profiles), which assists the analyst in the development of methods for high resolution sequential ICP-AES: no more solutions to prepare and no more profiles to acquire. The profile of each line is calculated according to the instrument’s configuration: focal length, slit combination, diffraction grating and order used. Only a few minutes are needed to select lines for every element.
Every user of an ULTIMA family instrument can have the benefit of CLIP to save time and enhance the quality of their results. Reader Reply Card no 192
IET
Annual Buyers Guide 2009
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