Analytical Instrumentation
Fast, Precise Elemental Analysis for Process Control
New Benchmark for Standardless XRF Analysis
PANalytical (The Netherlands) presents Omnian, the standardless analysis package. This latest module in the company’s proven SuperQ software suite is designed to be used with the Axios sequential X-ray fluorescence (XRF) spectrometer.
Omnian provides the ideal answer for characterisation and analysis of unknown samples for instance during refining processes, or in situations where certified standards that match specific sample characteristics are not available.
Omnian can handle a wide variety of sample types such as solids, pressed powders, fused beads, loose powders and liquids. The software is adaptable, depending on user experience or the desired mode of operation. With its problem-solving power it deals with analytical challenges including sample quantification, screening and failure analysis, as well as the comparison of different materials.
Omnian is set to become the new benchmark in these important applications. It is designed to provide fast, reliable quantification in the default ‘black box’ mode. However, the data collected is comprehensive and can be reviewed more extensively.
The system adjusts automatically to sample and matrix effects as well as sample thickness, volume and ‘Dark– Matrix’ composition. It can be fine-tuned for increased accuracy by using Adaptive Sample Characterisation (ASC).
The iQ II EDXRF Spectrometer gives precise, accurate analytical results on demanding process control samples, says manufacturer Spectro Analytical Instruments GmbH (Germany). Oil refiners, lubricating oil manufacturers, mineral and cement producers and many other industries will find this instrument attractive because of its simplicity of operation and impressive sensitivity for the often critical “light” elements like Na, Mg, Al, Si, P, S and Cl.
The advanced polarised X-ray optical system uses a curved HOPG (highly oriented pyrolytic graphite) crystal located very close to the sample, ensuring optimum excitation for light elements. By combining this optical system with a 50 kV X-ray tube and an exceptionally powerful Peltier-cooled Silicon Drift Detector, performance approaching that of much more expensive Wavelength Dispersive (WDXRF) instruments can be achieved in many applications, for both light and trace elements in liquid and loose powder samples, Helium flushing can be used with the iQ II to enhance light element performance, but unlike most small EDXRF instruments the user can also measure pelletised or fused samples under vacuum conditions, thereby dramatically reducing operating costs over the life of the instrument. A new generation of sample cassettes makes possible the extremely accurate sample positioning system in the iQ II, helping to achieve the high analytical precision required for industrial QC applications.
A selection of ready-to-go app - lications software packages is available for important applications such as ultra- low Sulphur in fuel oil, lubricating oil additives, cement and slag analysis. Where appropriate, these methods comply with international norms.
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New EDX-GP Energy Dispersive X-ray Fluorescence Spectrometer for RoHS/ELV Screening
The EDX-GP, the newest model in Shimadzu Scientific Instrument’s (USA) EDX series, offers fast, high-sensitivity measurements optimised for RoHS/ELV hazardous element screening with easy, automatic operation for first-time users.
The EDX-GP uses the same proprietary semiconductor detector as Shimadzu’s EDX-720 to deliver high sensitivity, high resolution and precision measurement of all light to heavy elements. The optical system, special filters and high count-rate circuit deliver ideal performance for RoHS/ELV screening. Optimal filters are automatically selected, and high- speed mode conditions are now installed by default to allow batch measurements of RoHS/ELV hazardous elements using a single filter. Users can complete a single-filter, high- speed analysis in 30 seconds, or a high-sensitivity analysis with a special filter in 300 seconds.
With the EDX-GP, operations that previously relied on a user’s judgment are now automated, including instrument start-up and calibration, and the selection of analytical conditions. The software also features a measurement time reduction function for high concentrations of hazardous elements and for samples containing no hazardous elements. This eliminates wasted measurements and achieves more efficient analysis.
In contrast to its compact size, the EDX-GP has a large sample chamber to accommodate as-is measurements of any sample shape or size. Users can load samples quickly and easily with a semiautomatic chamber door for high throughput with less workload.
Other standard functions include pre-measurement instrument check to determine if calibration is necessary; automatic material evaluation to pre-measure sample materials and select analytical conditions; shape correction to eliminate the effect of shape and thickness on results; and thin-film analysis for single- and multi-layer samples.
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June/July 2010
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