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Journal Highlights


Techniques and Material Applications


Electron Source Brightness and Illumination Semi-Angle Distribution Measurement in a Transmission Electron Microscope by F Börrnert, J Renner, and U Kaiser, Microsc Microanal | doi:10.1017/S1431927618000223


Electron source brightness is an important parameter of an electron microscope. Simple and reliable brightness measurement routes are not easily found. A method to determine the illumination semi-angle distri- bution in transmission electron microscopy is even less well documented. Herein, a facile way to measure the illumination semi-angle distribution and subsequently the electron source brightness in TEM is shown. T e basic principle is to evaluate the information limit via Young’s fringes tests for diff erent defoci. We found that it is not suffi cient to measure just one defocused value, rather it is necessary to include the higher order geomet- rical aberrations, as well as the other dampening envelope functions into the fi t. T e measurement method is demonstrated with the help of the SALVE instrument fi tted with a FEI X-FEG with monochromator, for which a reduced axial brightness of 1.8 10 8 A/(m 2 sr V) was measured.


Scheme for the illumination dampening mechanism. The gray shading represents parallel illumination originating from two discrete source points and thus shows an angular distribution with just one discrete angle.


A top journal in Microscopy


Editor   , University of Michigan, USA The only ourna


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Miicroscopy 


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 c bridge.org/mam/submit


View the journal online at cambridge.org/mam Micrrosccopy Soccietty py y of Am merica 2018 July • www.microscopy-today.com 57


Published for the Microscopy Society of America Ed tor:


Th on y jour al owned by scientists and published for scientists, Mcrosco y and Mic 


croanalysis provides original research papers in


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