IndustryNews
Cameca Announces Strategic Partnership with Polytechnique Montréal
In a partnership with Polytechnique Mon- tréal University, CAMECA will provide its latest atom probe tomography (APT) instru- ment for research. Te Invizo 6000 provides a patented electrostatic design enabling a
simultaneous increased field-of-view and enhanced mass resolv- ing power, a deep UV laser to promote enhanced ion emission, advanced dual-beam delivery optics improving specimen sym- metry, and a new extraction electrode design. Tese new features enhance specimen yield, increase data quality and analysis vol- umes, and expand the analytical capabilities of the APT method.
CAMECA
www.cameca.com
DECTRIS CEO Change Doesn’t Shift the Company’s Direction
Matthias Schneebeli became the DEC- TRIS CEO at the beginning of the year, giving board chairman Christian
Brönnimann a chance to focus on coaching and advising the team. The company is going through internal chang- es, but the strategy and customer support will stay on the plotted course.
DECTRIS
www.dectris.com
GATAN’s
WhatsCL.info Website Elevates the Cathodoluminescence Experience
Te
WhatsCL.info website continues to enhance the cathodoluminescence (CL) experience with a major upgrade. Many experimental briefs, application notes, and webinars that dig deeper into the many applications
of CL microscopy have been added. Some highlights are: 1) major, minor, and trace element distributions in a meteorite revealed by energy dispersive spectroscopy and cathodoluminescence spec- troscopy; 2) cathodoluminescence as a technique for inspection, metrology, and failure analysis of micro-LED processing; and 3) spectroscopic analysis of ultra-wide bandgap semiconductors.
Gatan
www.gatan.com
Linkam Updates its Humidity Control Range of Instruments
Linkam Scientific Instruments, an expert in sam- ple characterization, has launched the latest update to its range of humidity control systems. Te new RHGen Relative Humidity (RH) Controller offers
humidity control between 3% and 95%, at temperatures from ambient to 85°C, with an upgraded RH sensor and improved connectors. Tis provides environmental control to a variety of Linkam temperature control stages and third-party chambers.
Linkham Scientific Instruments
www.linkam.co.uk
2022 May •
www.microscopy-today.com
New Semiconductor Tool by Park Systems Combines Atomic Force Microscopy with White Light Interferometry
Park Systems has launched the Park NX-Hybrid WLI, an integrated system that combines atomic force microscopy (AFM) with white light interferometer (WLI) profilometry. WLI is a nonde- structive, non-contact, optical technique
used to generate 2D and 3D models of surfaces widely used for semiconductor production quality assurance. Te Park NX- Hybrid WLI is a powerful semiconductor metrology tool that incorporates the best of AFM and WLI technologies into one seamless system.
Park Systems
www.parksystems.com
COXEM Partners with JH Technologies for North American Distribution Coxem has announced JH Technologies as their new distributor for North America. JHT is a leading distributor of optical and digital imaging
systems and recently acquired the rights to distribute, market, and service the COXEM product line. JHT microscopy custom- ers oſten need higher magnification and resolution. Te ability to offer SEM imaging will help achieve this next important step.
JH Technologies and COXEM
www.jhtechnologies.com
www.coxem.com
Congratulations to Dr. Hideyuki Takahashi of JEOL
Dr. Hideyuki Takahashi of JEOL recently received the MAS Presiden- tial Science Award. He is known for his work in novel chemical mapping tech- niques in electron probe microanalysis (EPMA). Recently, he has been at the
forefront of soſt X-ray emission spectroscopy (SXES) in EPMA development. Dr. Takahashi has authored and co-authored over 80 papers and has been an invited speaker at many interna- tional conferences.
JEOL
www.jeolusa.com
Fastest FE-SEM by FBT
Focus e-Beam Technology has produced the world’s highest-throughput scanning electron microscope (SEM), Navigator-100 (field emis- sion), with imaging speeds more than 10 times the
throughput of a conventional SEM. Te direct electron detection methodology overcomes traditional SEM limitations in terms of sample damage, speed, and precision, essentially upgrading an SEM to a sub-nanometer camera. At the same time, the system provides ease of operation, is fully automatic, and provides 24/7 unattended operation capability to improve efficiency of scientific research.
Focus e-Beam Technology
www.focus-ebeam.com/en
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