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Silicon Drift Detector


Conclusion and Outlook In the years since the 1984 introduction of sideward deple-


tion by Gatti and Rehak, what is now known as the silicon driſt detector (SDD) has had an important influence on the detection of ionizing radiation in a number of scientific instruments. Tis is particularly true for X-ray spectrometer systems for electron microscopes. Tese systems are compact, robust, do not require liquid nitrogen, and are capable of high count rates while main- taining exceptional energy resolution. Te future of SDD tech- nology is bright: multi-channel pixelized SDDs that increase the count rate capability are currently under development. In addi- tion, new integrated amplifying schemes are being developed to get even closer to the Fano limit at very low X-ray energies.


Acknowledgement Te authors appreciate the constructive comments and discussions with Charles Lyman, Lehigh University.


References [1] E Gatti and P Rehak, Nucl Instrum Methods 225 (1984) 608–14. [2] R Fitzgerald et al., Science 159 (1968) 528–30. [3] XFLASH 4 brochure, Röntec GmbH Berlin, now Bruker Nano GmbH Berlin, March 1997.


Figure 10: Lithium mapping in battery research. (a) X-ray spectrum acquired at 5 kV showing the Li-K line at 54 eV, the first peak separated from the noise at the left. Carbon and oxygen K lines are at 277 eV and 525 eV, respectively. The spectrum also shows phosphorus and sulfur K and L lines. The total noise of the system was below 2 electrons (rms). (b) Composite of lithium (magenta) and oxygen (green) X-ray maps. Image width = 88 μm. Courtesy of Thermo Fisher Scientific.


10b shows a composite of two X-ray maps revealing the loca- tions of a lithium-rich phase (magenta) and an oxygen-rich phase (green). Commercial systems. Several companies fabricate SDD


chips and modules for use in X-ray microanalysis systems: PNDetector, Amptek, and Ketek [17] are currently the three major players in the field of high-quality SDDs. Tese original equipment manufacturers (OEMs) supply SDD chips to several producers of complete X-ray spectrometer systems that com- bine the SDD with user-friendly spectrum-imaging soſtware for microanalysis in the SEM and TEM. Some research labo- ratories have employed specialized SDDs in large instruments such as particle accelerators and synchrotrons.


[4] P Lechner et al., Nucl Instrum Methods 377 (1996) 346–51. [5] C Guazzoni, Nucl Instrum Meth A 624 (2010) 247–54. [6] WS Boyle and GE Smith, Bell Syst Tech J 49 (1970) 587–93. [7] G Lutz, Semiconductor Radiation Detectors, Springer, New York, 2007.


[8] L Strüder and H Soltau, Radiat Prot Dosim 61 (1995) 39–46. [9] C Fiorini et al., Rev Sci Instrum 68 (1997) 2461.


[10] L Strüder et al., Microsc Microanal 4 (1998) 622–31. [11] DE Newbury and NW Ritchie, J Mater Sci 50 (2015) 493–518. [12] H Soltau et al., Microsc Microanal 10(Suppl 2) (2004) 1046–47. [13] H Soltau et al., Microsc Microanal 14 (Suppl 2) (2008) 1156–57.


[14] A Niculae et al., Microsc Microanal 25 (Suppl 2) (2019) 1768–69.


[15] C Fiorini et al., IEEE T Nucl Sci 59 (2012) 537–44. [16] A Niculae et al., Microsc Microanal 19 (Suppl 2) (2013) 1270–71.


[17] PNDetector: https://www.pndetector.de, Amptek: https:// www.amptek.com, Ketek: https://www.ketek.net.


2020 September • www.microscopy-today.com


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