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MicroscopyInnovations


Te label-free localization method provides super-resolved images from blood vessels under flow conditions, but not from blocked blood vessels. If a blood vessel is blocked and RBCs are not flowing, such as in strokes, the blood vessel is not visible.


PrismaXRM Sigray, Inc. Developer: Wenbing Yun


Tree-dimensional X-ray micros-


copy (also known as micro-CT) has developed substantially in the past two decades, and many systems are now reaching the limits of resolu- tion achievable at


high through- put. PrismaXRM was designed to


overcome this resolution limit through a novel, multi-contrast approach that provides critical information on sub-resolution features, such as cracks and nanoparticles. Te PrismaXRM system takes advantage of the fact that X-rays interact with samples through a variety of means. Until now, X-ray imaging systems, including medical X-ray units and X-ray microscopes, have relied on absorption contrast to produce images. However, X-rays are also slightly refracted from their path, resulting in a phase shiſt of the X-ray waves transmitted through the object and scattered at an angle. Such phenomena have been challeng- ing to detect until the recent innovation of grating-based inter- ferometry (GBI). PrismaXRM employs a grating-based approach to enable


simultaneous acquisition of three modes of contrast: absorption, Quantitative Phase™, and Subresolution Darkfield™, that have proven to be powerful in their complementary nature. A key enabling feature of the system is Sigray’s microstructured X-ray source. Te source employs a diamond target with an array of embedded microstructures to provide the illumination required for the grating-based technique to work. When the structured illumination is incident upon a downstream grating (G1), a pattern of constructive and destructive interference fringes is produced. Measurement of how a sample alters the interfer- ence fringe field through absorption (attenuation of fringe), phase (shiſting of the fringe), and darkfield (amplitude decrease) provides the simultaneous acquisition of the three contrast mechanisms. Te three modes of contrast complement each other by providing information that the others may not detect. Quantitative Phase™ enables determination of material refractive indices and distinguishes between similarly absorbing materials such as two types of polymers. Subresolution Darkfield™ pro- vides access to information on features below the limitations of resolution, such as nanoparticles, pores, and cracks. Applications range from semiconductor devices to lith-


ium batteries to carbon fiber-reinforced polymers to con- crete, including in situ observations of


low-contrast fluid


flow through pore networks. For example, Subresolution 24


Darkfield™ has elucidated patterns of lithium ion nanopar- ticle migration into a porous carbon cathode in an intact lithium-air battery.


ORION NanoFab SIMS Carl Zeiss SMT


Developers: Sybren Sijbrandij, David Dowsett, and Tom Wirtz


Te ORION NanoFab uses a gas


field ionization source (GFIS) to pro- duce a well-focused beam of helium or neon ions with remarkably small probe sizes, typically 0.5 nm and 1.9 nm, respectively. Tis instrument provides high-resolution helium ion microscopy (HIM), focused ion beam (FIB) milling, and now micro- analysis


via secondary ion mass spectrometry (SIMS). Te optional


SIMS spectrometer is fully retractable, so it does not inter- fere with any of the instrument’s other capabilities when not in use. As a focused neon beam sputters the sample, those charged atoms, molecular fragments, and small clusters are extracted and directed to the spectrometer. Positive or nega- tive species can be collected with the polarity switchover taking less than a minute. Under the influence of a magnetic field, the charged particles are sorted based on their mass-to- charge ratios as they are individually focused to the detector focal plane. Tere are five channeltron detectors: one for mea- suring the total ion current and four that can be positioned to collect the signal corresponding to a specific mass-to-charge ratio. Te range of detectable masses spans from hydrogen to uranium with a mass resolution of m/Δm ∼ 400. Tus equipped, the NanoFab can serve many applications


with a variety of workflows. Most commonly, the operator will first use the 0.5 nm helium ion beam to navigate and save images of the features of interest before switching to neon ions to begin the SIMS analysis. If desired, a full mass spectrum can be acquired by sweeping the magnetic field or moving the detectors. When the magnetic field strength is held constant, the detectors may be moved to collect the masses of interest. Scanning the neon beam in a traditional raster pattern


allows mass-filtered images to be acquired with a spatial reso- lution of about 10 nm, revealing distributions of chosen atoms, molecular fragments, or clusters. Repeated rastering of the same area will progressively expose deeper layers, and the sequence of images can be combined to reveal 3D composi- tional information. Unlike SEM with EDX, this technique is extremely surface sensitive, can distinguish different isotopes, and needs no special provisions to see light elements like lith- ium or hydrogen.


www.microscopy-today.com • 2020 September


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