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MicroscopyEducation


Figure 5: From the Mode and Image Selection page, each user can select from introduction, learning, or self-assessment modes and the image to be used dur- ing simulation.


for other instruments, such as a SEM and a focused ion beam instrument; and problem sets, where students perform experi- ments using specified techniques. A long-term goal for the OEMP is to produce a generalizable program structure that can be adapted broadly to support different types of instru- ment simulators. Users from other institutions will be able to contribute to the platform by helping to develop simulators for their areas of interest, or by contributing content to our virtual specimen and problem set database.


Acknowledgements Te authors would like to acknowledge funding from the


Figure 6: In-class assessment scores showing that the OEMP improved prac- tical skills and helped students understand TEM theory.


50


W. M. Keck Foundation and thank TermoFisher Scientific (formerly FEI), Oxford Instruments, and Gatan for their sup- port. TermoFisher, Oxford Instruments, and Gatan allowed us to use their soſtware user interface designs in developing the TEM simulator, and TermoFisher provided text and images to be used for help documents in the simulator.


www.microscopy-today.com • 2020 March


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