MicroscopyEducation
Figure 1: Image of the user interface showing the lecture content and microscope controls available. The OEMP offers high-fidelity online simulation of electron microscopes including lecture material and controls for interfacing with the virtual microscope.
Electron Microscope Simulator At the heart of the OEMP is an electron microscope simu-
lator designed to provide users with virtual lab practice. Other electron microscope simulators have been established, such as Microscopy Australia’s SEM and TEM simulators [11,15]. Tese are beginner-friendly, with step-by-step guides to direct the user in operation. However, they do not allow for a full, comprehensive range of operations on the electron micro- scope. Users are also forced to operate the VM with guidance, and independent practice of instrument setup is not allowed. In contrast, the OEMP VM has an unparalleled breadth of functionality, and all guidance is optional. Tis grants users the freedom to explore, make mistakes, and learn by doing, all without risk to any actual instrument. Te electron microscope simulator we developed is based
on the FEI Tecnai F-20 TEM/STEM. Te simulator includes simulated controls and a user interface that matches the real hardware and soſtware employed in operating the TEM (Figure 1). Accompanying the interface is a visual display of the microscope column, allowing users to see the various components at work in the microscope from the electron gun, down through various apertures and lenses, all the way to the viewing screen. Users can also view the fluorescent screen itself to see the virtual specimen they are working with (Figure 2). Te simulator is capable of multiple modes of opera- tion. Tese modes include imaging, diffraction, scanning,
2020 March •
www.microscopy-today.com
energy-dispersive X-ray spectroscopy (EDX), electron energy loss spectroscopy (EELS), and energy-filtered transmission electron microscopy (EFTEM). Information provided through the VM is based on the virtual specimen and mode chosen by the user. For example, in the imaging mode, users see a high- resolution picture of the specimen, while in the diffraction mode users see a dot pattern based on the crystal structure of the element at the center of the electron beam. Via the on-screen controls, users can perform several
functions to adjust the image seen. Tese functions include beam shiſt, stage movement, and direct alignments. Users can adjust magnification, focus, intensity, apertures, stigmators, and spot size. Each manipulation is performed with simu- lated knobs, buttons, and trackballs that mirror actual control design.
The Online Electron Microscopy Platform (OEMP) Te OEMP is a website that uniquely integrates electron
microscope simulators with more traditional classroom con- tent, such as lectures and homework. Tere are no limits on how many users may simultaneously access the OEMP. From the main page (Figure 3), users can customize their syllabus, select a virtual specimen to view in the simulator, resume using the simulator with their last selected specimen, or con- tribute data to the platform. Currently students may only access the TEM simulator, but other simulators are planned for future development.
47
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76
