50th


A NNI V ER S A RY • 19 70 -2020


May 31 – June 5, 2020 L EHIGH UNI V ER S IT Y, BETHL EHEM, PA


MAIN COURSE Scanning Electron Microscopy and X-Ray Microanalysis JUNE 1-5


INTRODUCTORY COURSES Introduction to SEM and EDS for the New Operator MAY 31


Introduction to TEM MAY 31


For more information contact Nikki Rump at 610.758.1112 or nikki.rump@lehigh.edu


SPECIALIZED COURSES Focused Ion Beam (FIB): Instrumentation and Applications JUNE 1-5


Quantitative X-Ray Microanalysis: Problem Solving Using EDS and WDS Techniques JUNE 1-5


Transmission Electron Microscopy JUNE 1-5


Register and pay in full by April 10 to get an early bird discount. For more information visit: lehigh.edu/microscopy


MEO Engineering Ads March 2020.pdf 1 1/16/20 9:12 PM MEO Engineering Ads March 2020.pdf 2 1/16/20 9:12 PM


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