From the Editor Microscopy Today Innovation Awards
T is issue showcases the winners of the second annual Microscopy Today Innovation
Awards competition. T ese awards were established to honor innovative microscopy- related products and methods that appeared in the previous year. T e team of judges, led by Tom Kelly, looked for innova tions that will make new
scientifi c investigations possible. T e ten winning innovations are selected on the basis of their importance and usefulness to the microscopy community. T e entries most likely to win are those that provide better, faster, or entirely new methods of analysis by some type of microscope or microanalytical instrument. T e following innovations received 2011 Microscopy Today Innovation Awards:
Anasys Instruments nanoIRTM provides AFM-based infrared spectroscopy
Multimodal Optical Nanoprobe examines specimens with a laser in TEM Fischione Model 2540 in situ environmental heating TEM holder NanoMEGAS ASTAR crystal orientation and phase mapping system for TEM Nikon N-SIM structured illumination super-resolution microscope Electrochemical Strain Microscopy in scanning probe microscopy Resolution Optics Desktop Digital In-Line Holographic Microscope Semrock VersaChrome tunable thin-fi lm bandpass fi lters STAR Cryoelectronics microcalorimeter x-ray spectrometer WITec True Surface Microscopy improves confocal Raman imaging
Descriptions of these innovations are provided in an article within this issue.
Congratulations to the developers of these instruments and methods. Details of the nomination process for the 2012 Microscopy Today Innovation
Awards will be posted on the Microscopy Today website (
www.microscopy-today.com) by January 1, 2012. Nomination applications will be accepted through March 1, 2012.
Charles Lyman Editor-in-Chief
Publication Objective: to provide information of interest to microscopists.
Microscopy Today is a controlled-circulation trade magazine owned by the Microscopy Society of America that is published six times a year in the odd months. Editorial coverage spans all microscopy techniques including light microscopy, scanning probe microscopy, electron microscopy, ion-beam techniques, and the wide range of microanalytical methods. Readers and authors come from both the life sciences and the physical sciences. The typical length of an article is about 2,000 words plus fi gures and tables; feature articles are longer. Interested authors should consult “Instructions for Contributors” on the Microscopy Today website:
www.microscopy-today.com.
ISSN 1551-9295
Disclaimer The Microscopy Society of America and the editors cannot be held responsible for opinions, errors, or for any consequences arising from the use of information contained in Microscopy Today. The appearance of advertising in Microscopy Today does not constitute an endorsement or approval by the Microscopy Society of America of any claims or information found in the advertisements. By submitting a manuscript to Microscopy Today, the author warrants that the article is original or that the author has written permission to use copyrighted material published elsewhere. While the contents of this magazine are believed to be accurate at press time, neither the Microscopy Society of America, the editors, nor the authors can accept legal responsibility for errors or omissions.
© Copyright 2011 by the Microscopy Society of America. All rights reserved.
Editorial Staff
Charles E. Lyman, Editor-in-Chief
charles.lyman@
lehigh.edu (610) 758-4249
Gennifer Levey, Production Manager
glevey@meridianartproduction.com (212) 780-0315
Ron Anderson, Executive Editor
microscopytoday@tampabay.rr.com
Phil Oshel, Technical Editor
oshel1pe@cmich.edu
Stephen Carmichael, Columnist
carmichael.stephen@
mayo.edu
Michael Davidson, Pioneers Editor
davidson@magnet.fsu.edu
Steven Barlow, Education Editor
sbarlow@sunstroke.sdsu.edu
Thomas E. Phillips, Consulting Editor
phillipst@missouri.edu
E. Ann Ellis, Microscopy 101 Editor
eann.ellis@worldnet.att.net
Paul Webster, Calendar Editor
pwebster@usc.edu
John Shields, Humor Editor
jpshield@uga.edu
Thomas Kelly, Chief Awards Judge T
omas.kelly@
ametek.com
Advertising Sales M.J. Mrvica Associates, Inc. 2 West Taunton Avenue, Berlin, NJ 08009
mjmrvica@mrvica.com (856) 768-9360
Amy Reuter, Account Manager
areuter@mrvica.com
Magazine website:
http://www.microscopy-today.com Free subscriptions are available
Publisher Cambridge University Press 32 Avenue of the Americas New York, NY 10013-2473 (212) 337-5000
Circulation: 17,000
Editorial Board Arlan Benscoter, Lehigh University John Bozzola, Southern Illinois University Peter Crozier, Arizona State University Vinayak Dravid, Northwestern University Joseph Goldstein, University of Massachusetts Bryan Huey, University of Connecticut John Mackenzie, North Carolina State Univ. Paul Maddox, University of Montreal Ania Majewska, U. Rochester Med School Greg Meeker, U.S. Geological Survey Joseph Michael, Sandia National Labs Caroline Miller, Indiana University Robert Price, University of South Carolina John Reffner, John Jay College, SUNY Ian Robertson, University of Illinois Phillip Russell, Appalachian State University Glenn Shipley, Citizen Microscopist Robert Simmons, Georgia State University Paul Voyles, University of Wisconsin Simon Watkins, University of Pittsburgh Cynthia Zeissler, Nat. Inst. of Sci. and Tech. (NIST)
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