Quietly Building Capabilities
Scanning/Transmission Electron Microscope (S/TEM).
Figure 2 shows the FEI Titan S/TEM, a high-demand instrument in EMSL that will be moved into the Quiet Wing upon its completion. Tis aberration-corrected instrument offers spatial resolution of 0.1 nm (STEM mode) and energy resolution of 0.3 eV. It is referred to as a “multi-purpose tool” for research involving energy materials, catalysis, interfacial phenomena, and nanostructured materials because of its superior structural imaging and chemical analysis on an atomic level. Te instrument is equipped with a monochromator that improves energy resolution for electron energy-loss spectroscopy (EELS) to a level where not only chemical elements can be analyzed but also their binding state. Te electron probe corrector in combination with the monochromator allows elemental and chemical analysis with high spatial resolution on an atomic level. Energy-dispersive X-ray spectroscopy (EDXS) is also available for detection and quantification of all elements heavier than boron. Te three attachments mentioned above convert this instrument into a powerful tool for analytical electron microscopy. Te scope of available experiments can also be extended to in situ studies of dynamic processes by using sample holders that can control temperature, electrical current, and gaseous environment. Environmental Transmission Electron Microscope
(ETEM). Te Quiet Wing will host an FEI ETEM, which is dedicated to in situ experiments for a wide range of research applications, including interfacial phenomena, chemical science and engineering, nanoscience technology, materials
science, environmental science, and biogeoscience. For this purpose, it is equipped with an integrated environmental cell, which allows precise control of pressure and gas composition while simultaneously allowing control of electrical current, magnetic field, and temperature. Pressures up to 20 mbar and temperatures up to 1000°C are available for dynamic studies. In situ experiments require high time resolution, which makes TEM imaging the preferred operational mode. Terefore, an image corrector is integrated into the instrument to eliminate image artifacts such as contrast delocalization, which scramble structural information. Tese features provide in situ capabilities with atomic-resolution imaging to study dynamic processes. Trough these features and the ETEM’s advantages in large-field imaging for structural interface analysis, the instrument will accelerate research in catalysis, growth of nanowires, evolution of nanoparticle morphology, and organization of molecules. Helium Ion Microscope (HIM). Figure 3 shows the first-
ever helium-ion microscope to become available at a national scientific user facility. We believe this tool, manufactured by Carl Zeiss NTS, opens the door to vital new experimentation in catalyst nanostructures; biological, geochemical, and biogeochemical processes; and surface/interface studies. Te HIM provides ultra-high-resolution images (with spatial resolution down to 0.35 nm) on a wide range of materials, including insulators, through high contrast and superior depth-of-field. Specifically, this instrument minimizes damage to biological samples and offers a Rutherford backscattering spectrometry (RBS) detector to identify atomic elements and determine material composition. Ultra-High Vacuum, Low-Temperature, Scanning Probe
Microscope (UHV LT SPM). Manufactured by Omicron NanoTechnology, this tool provides a unique combination of capabilities to examine the molecular details of chemical reactions—particularly those important for heterogeneous catalysis and photocatalysis. With atomic-level spatial resolution and vertical resolution better than .01 nm, the UHV LT SPM
Figure 2: EMSL’s aberration-corrected FEI Titan scanning/transmission electron microscope
(S/TEM) 50 provides high-resolution sub-angstrom resolution and spectroscopic capabilities.
imaging with
Figure 3: The Quiet Wing will house the first helium ion microscope (Carl Zeiss) available at a national scientific user facility.
www.microscopy-today.com • 2011 September
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