2011 Innovation Awards
detects light elements including oxygen, and achieves an energy resolution of better than 10 eV at 1.74 keV (Si K line), about 10 times better than that of conventional EDS. At electron beam energies below 3 kV, the Microcal EDS allows analysis at the nanometer scale for thin films and nanoparticles. A 16-pixel detector array provides total count rates of 10 kcps and higher.
True Surface Microscopy WITec GmbH
Developers: Olaf Hollricher, Wolfram Ibach, Peter Spizig, Detlef Sanchen, and Gerhard Volswinkler WITec’s new True Surface
Microscopy option allows confocal (Raman) imaging guided by surface topography. True Surface Microscopy follows the surface topography with high precision, so that even rough or
inclined samples always stay in focus while performing confocal (Raman) imaging. To achieve this capability, the WITec alpha500 series integrates a precise sensor for optical profilometry. Te topographic coordinates from
the profilometer measurement are used to follow the sample surface in confocal (Raman) imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. On such surfaces, this information was only partially accessible before now. The topographic sensor works using the confocal chromatic sensor principal. A white-light point-source is focused onto the sample with a hyperchromatic lens assembly, which is a lens system that has a good point-mapping capability but a strong linear chromatic error. Every color has therefore a different focal distance. The light ref lected from the sample is collected with the same lens system and focused through a pinhole onto a spectrometer. As only one specific color is in focus at the sample surface, only this light can pass through the confocal pinhole. The detected wavelength is therefore related to the surface topography. Scanning the sample in the XY plane (up to 50 × 100 mm) generates a topographic map of the sample. This topography can then be followed in a subsequent confocal (Raman) imaging measurement so that the laser is always kept in focus with the sample surface (or at any set distance below the surface). Depending on the type of sensor used, a lateral resolution of 10–25 μm and a vertical resolution of 40–120 nm can be achieved within a measurement range of 1–3 mm and a working distance of 10–16 mm.
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Members Receive: • A personal subscription to MSA’s official journal, Microscopy and Microanalysis, and MSA’s popular bi-monthly magazine, Microscopy Today.
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Join MSA Today! 2011 September •
www.microscopy-today.com For more information: visit
www.microscopy.org or call 1-800-538-3672 47
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