Feature sponsored by


Test & measurement


Figure 1: Pros and cons of standalone vs modular test and measurement equipment.


oscilloscopes, and multimeters in varying configurations to implement a test setup. In short, modular instruments reign for ATE - the same equipment and fixture mechanics (e.g., robotic arm, multi-axis positioning systems, etc.) can be used to perform a singular test multiple times without manual intervention (refer to Figure 1). The benefits of PXI test equipment call for creative solutions to enhance its portability and accessibility.


Applications


R&D / Experiment General Purpose Test & Measurement


LED, Motor, Semiconductor QC/ Functional Tests


Audio Tests Power Supply Tests Vibration Tests Partial Discharge Tests


PROBLEMS ENDEMIC TO A LACK OF TESTING FLEXIBILITY AND PORTABILITY This enables portable testing over the flexible PXI chassis, filling unique testing niches such as highly accurate mobile quality control testing in a production environment without sacrificing feature functions or high performance. This is critical in modern electronics manufacturing environments. The Apple Watch, for instance, integrates nearly 900 modules, including twenty CPUs, memory, touch control, radio modules (e.g., WiFi, NFC, etc), and its respective power tree. Conventional testing methodologies for IC


production lines involve numerous types of machines and equipment, all subject to change with a new product iteration. The


PXI-based Modules


Multi-meter Waveform Generator Oscilloscope DAQ


Programmable PSU High Speed PXIe Digital IO Card


DSA DIO Control


Digitizer DIO Control


DSA Digitizer Table 1: Small-scale T&M Applications Instrumentation Monthly January 2023


Continued on page 26... 25


dynamic testing environment limits the ability to automate tests, often beginning a new learning curve and adjustment period for operators to perform optimal tests and measure an IC. This very fact increases the testing time, which increases the cost of operation and the human error associated with adjusting to a new test system, ultimately impacting yield rate. This very same problem can be seen in tests


for research and development (R&D). Classical test benches often require a combination between multiple box-type modules and older, relatively cumbersome PXIes systems to perform a singular test (See Table 1). For instance, the characterisation of a power amplifier would require not only power amplification functions, but also the need for a high-order filter, power


Required Module Q’ty 3-4 pcs 1-2 pcs 1-2 pcs 1-2 pcs 1-2 pcs 1-2 pcs


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