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Test & measurement


matrix modules offer bandwidths ranging from 35MHz to 70MHz depending upon path selected and a VSWR <1.5:1 to 85MHz. The modules are in two-slot PXI (model 40-588) or PXIe (model


P


42-588) formats and are constructed using telecommunication grade electromechanical relays capable of hot or cold switching up to 2A at 220VDC/250VAC. Every signal has an accompanying analogue ground connection on the front panel connectors for interfacing with cabling accessories. Simple matrix expansion is facilitated by two groups of front panel Y-axis connections on the 32×8 variant. Pickering’s Switching product manager, Steve Edwards


comments: “The 40/42-588 modules’ increased bandwidth provides compatibility with higher frequency test signals. With careful matrix design and isolation switching, a high switching capacity can still be offered while maintaining excellent RF performance. These modules also offer electrically compatible replacement of another vendor’s legacy VXI switching product. This compatibility is part of Pickering’s VXI to PXI replacement program.” The new 40/42-588 high capacity, high bandwidth


switching matrix modules are suitable for upgrades to legacy systems or new automated test equipment (ATE) designs in demanding automotive and defence applications. The modules are supported by Pickering’s eBIRST diagnostic test tools. Like all Pickering’s products, the 40/42-588 modules carry a three-year warranty, and come with spare relays that allows customers—with appropriate training—to do repairs on-site, minimising system downtime. A range of interconnect accessories are also available to support the 40/42-588 family.


Pickering Interfaces


report the limitations of near-infrared- visible-ultraviolet-spectroscopic ellipsometry (NIR-VIS-UV-SE) and infrared-spectroscopic ellipsometry (IR- SE) (in terms of carrier concentration) by investigating the transport mechanisms of indium tin oxide, aluminum-doped zinc oxide and gallium-doped zinc oxide. Optical characterisation was


I


performed with a J. A. Woollam Mark II IR Variable Angle Spectroscopic Ellipsometry (VASE). The IR-VASE is the first and only spectroscopic ellipsometer to combine the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. The IR-VASE covers the wide spectral range from 1.7 to 30 microns (333 to 5,900 wavenumbers). It is used to characterise both thin films and bulk materials in research and industry. This rapidly growing technology is finding uses in the optical coatings, semiconductor, biological and chemical industries, as well as research labs. You can find out more about the IR-VASE from the experts at Quantum Design UK & Ireland.


Quantum Design UK & Ireland qd-uki.co.uk


26 * https://pubs.acs.org/doi/10.1021/acsphotonics.0c00389 March 2021 Instrumentation Monthly from Nottingham Trent University WHen ellIPsometry Works best


n a new article published in ACS Photonics*, a team led by researchers


www.pickeringtest.com


ickering Interfaces has launched the industry’s highest bandwidth general purpose PXI matrix. Available in 16×8, 2- pole, or high-density 32×8, 2-pole switching configurations, the


Highest bandwidth general purpose PXI matrix


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