Molecular and Microanalysis


n Raman Spectroscopy and AFM-Raman n AFM n Cathodoluminescence n Fluorescence n Surface Plasmon Resonance imaging


Optical Spectroscopy


n Diffraction Gratings n Detectors n OEM Spectrometers n Monochromators


Particle Characterization


n Laser Diffraction n Light Scattering n Zeta Potential


Elemental Analysis


n ICP-OES n C/S and O/N/H Analyzers n XRF and µXRF Analyzers n S Analyzers in Petroleum Products n Sample Preparation


Surface and Thin Film Characterization


n Ellipsometry n GD-OES n PP-TOFMSTM


Forensics


n Light Sources n Image Treatment Software n Databases


Follow us! www.horiba.com/scientific


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72