3D Fourier Transform Analysis


and roughly evaluate the highest spatial frequency contrib- uting linearly to image formation. If you are really interested in evaluating your microscope more accurately, then try an elaborate tilted-beam 3D FT analysis that can exclude the eff ects from rotationally symmetric attenuation factors.


Acknowledgements T e authors are heavily indebted to Prof. C. Lyman,


the editor of Microscopy Today , who has made appropriate comments and encouraged us to make the article more readable for a wider audience. T is study was partly supported by the JST Research Acceleration Program and the Nano Platform Program of MEXT, Japan.


References [1] J Barthel and A T ust , Phys Rev Lett 101 ( 2008 ) 200801 . [2] M Haider et al ., Microsc Microanal 16 ( 2010 ) 393 – 408 . [3] K Kimoto et al ., Ultramicroscopy 121 ( 2012 ) 31 – 39 . [4] K Kimoto et al ., Ultramicroscopy 134 ( 2013 ) 86 – 93 . [5] K Ishizuka , Ultramicroscopy 5 ( 1980 ) 55 – 65 . [6] F T on , Z Naturforsch 21a ( 1968 ) 476 – 78 . [7] K Ishizuka and K Kimoto , Microsc Microanal 22 ( 2016 ) 971 – 80 .


[8] JCH Spence , High-Resolution Electron Microscopy , T ird Edition , Oxford University Press , New York , 2003 .


[9] Acquire Image Series: https://www.hremresearch.com/ Eng/plugin/plugin002/index.html .


[10] IPU (Image Processing Utility): https://www.hremre- search.com/Eng/plugin/plugin004/index.html .


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