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From the Editor


2017 Microscopy Today Innovation Awards


Congratulations to the winners of the eighth annual Microscopy Today Innovation Awards competition. T ese awards honor innovative microscopy-related products and methods that appeared in the previous year.


Our team of judges, led by Tom Kelly, looked for innovations that will make new


scientifi c investigations possible. T e ten winning innovations were selected on the basis of their importance and usefulness to the microscopy community. T e entries most likely to win are those that provide better or entirely new methods of analysis using some type of microscope or microanalytical instrument.


T e 2017 Microscopy Today Innovation Award winners are: Aalto University (Finland) for the black-silicon induced-junction silicon photodiode Bruker-Hysitron for NanoScratch in-situ nanomechanical testing in the SEM Keyence Corporation of America for the VR-3000 non-contact wide-area 3D measurement system


University of Missouri for the plasmonic grating platform to replace glass slides University of Newcastle (Australia) for the scanning helium atom microscope Oak Ridge National Laboratory and the University of Uppsala (Sweden) for a STEM method to observe magnetic ordering with atomic resolution Phasefocus for the Livecyte


Scripps Institution of Oceanography for the benthic underwater microscope University of Washington and Shenzhen Institutes of Advanced Technology for scanning thermo-ionic microscopy Yale University for multimodal imaging using a coherence switching laser


® Kinetic Cytometer to analyze live cell populations


Descriptions of the above innovations are given in an article within this issue. Nomination applications for the next competition are available upon request (charles.lyman@lehigh.edu). T e deadline for the next competition is March 21, 2018.


Charles Lyman Editor-in-Chief


Publication Objective: to provide information of interest to microscopists.


Microscopy Today is a controlled-circulation trade magazine owned by the Microscopy Society of America that is published six times a year in the odd months. Editorial coverage spans all microscopy techniques including light microscopy, scanning probe microscopy, electron microscopy, ion-beam techniques, and the wide range of microanalytical methods. Readers and authors come from both the life sciences and the physical sciences. The typical length of an article is about 2,000 words plus fi gures and tables; feature articles are longer. Interested authors should consult “Instructions for Contributors” on the Microscopy Today website: www.microscopy-today.com.


ISSN 1551-9295


Disclaimer The Microscopy Society of America and the editors cannot be held responsible for opinions, errors, or for any consequences arising from the use of information contained in Microscopy Today. The appearance of advertising in Microscopy Today does not constitute an endorsement or approval by the Microscopy Society of America of any claims or information found in the advertisements. By submitting a manuscript to Microscopy Today, the author warrants that the article is original or that the author has written permission to use copyrighted material published elsewhere. While the contents of this magazine are believed to be accurate at press time, neither the Microscopy Society of America, the editors, nor the authors can accept legal responsibility for errors or omissions.


© Copyright 2017 by the Microscopy Society of America. All rights reserved.


Editorial Staff


Charles E. Lyman, Editor-in-Chief charles.lyman@lehigh.edu (610) 758-4249


Gennifer Levey, Production Manager glevey@meridianartpro.com (212) 780-0315


Ron Anderson, Executive Editor randerson20@tampabay.rr.com Phil Oshel, Technical Editor oshel1pe@cmich.edu Robert Price, Associate Editor bob.price@uscmed.sc.edu Stephen Carmichael, Columnist carmichael.stephen@mayo.edu Eric Clark, Pioneers Editor eclark@magnet.fsu.edu Richard Edelmann, Education Editor edelmare@miamioh.edu Deb Kelly, Microscopy 101 Editor debkelly@vt.edu Thomas E. Phillips, Consulting Editor phillipst@missouri.edu Paul Webster, Calendar Editor p.webster@oak-crest.org John Shields, Humor Editor jpshield@uga.edu Nikolaus Cordes, Digital Content Editor ncordes@lanl.gov Thomas Kelly, Chief Awards Judge T omas.kelly@ametek.com


Advertising Sales M.J. Mrvica Associates, Inc. 2 West Taunton Avenue, Berlin, NJ 08009 mjmrvica@mrvica.com (856) 768-9360


Kelly Miller, Account Manager kmiller@mrvica.com


Magazine website:


http://www.microscopy-today.com Free subscriptions are available


Publisher Cambridge University Press One Liberty Plaza, 20th Floor New York, New York 10006


(212) 337-5000 Circulation: 18,000


Editorial Board Arlan Benscoter, Lehigh University John Bozzola, Southern Illinois University Peter Crozier, Arizona State University Vinayak Dravid, Northwestern University David Grubb, Cornell University Bryan Huey, University of Connecticut Heather Lowers, U.S. Geological Survey John Mackenzie, North Carolina State Univ. Paul Maddox, U. of North Carolina–Chapel Hill Ania Majewska, U. Rochester Med School Joseph Michael, Sandia National Labs Caroline Miller, Indiana University Brian M. Patterson, Los Alamos National Lab John Reffner, John Jay College, SUNY Ian Robertson, University of Wisconsin Phillip Russell, Appalachian State University Glenn Shipley, Citizen Microscopist Robert Simmons, Georgia State University Bradley Thiel, SUNY Polytechnic Institute Paul Voyles, University of Wisconsin Simon Watkins, University of Pittsburgh Cynthia Zeissler, Nat. Inst. of Stds. and Tech. (NIST)


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