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Go Big – Think Small


Atom Probe Tomography (APT) is the only material analysis technique offering extensive capabilities for simultaneous 3D imaging and chemical composition measurements at the atomic scale. Leading academic institutions use APT for groundbreaking research, and world-class manufacturers rely on APT for process improvement and materials innovation.


Atomic-level samples generated by APT reveal 3D chemical information not visible via other microscopy techniques.


3D volume showing the pure Si fin surrounded by the metal gate structure in a 14 nm microprocessor device


Boron segregation to a grain boundary in a Ni superalloy with carbide and boride precipitates


GaN LED device structure with Mg precipitation (red) and InGaN quantum well structure (purple)


CAMECA, the recognized world leader in atom probe development and manufacturing, offers two leading-edge APT instruments: the EIKOS™ and the LEAP® 5000.


EIKOS™ is an easier-to-use atom probe microscope, with a lower cost of ownership enabling faster development of alloys for industrial use and a deep understanding of materials for research applications.


The LEAP™ 5000 is CAMECA's cutting-edge atom probe microscope, offering superior detection efficiency and yield across a wide variety of metals, semiconductors and insulators.


Atom Probe Tomography is the only microanaytical technique that can provide full insight into the nanostructures of your materials. See more, learn more, make more. Accomplish big things by thinking small.


www.cameca.com cameca.info@ametek.com


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