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Product News Helios G4 Plasma Focused Ion Beam (FIB) System


The G4’s FIB and proprietary Dx chemistry is used to expose metallization layers, allowing electrical fault isolation and analysis to be performed down to the 7 nm node and offers automated end pointing that stops milling automatically when the metal or via layer of interest is exposed. It provides up to 10–20 times faster milling rates than conven- tional (Ga+) FIB solutions, allowing engineers to create larger samples for nanoprobing and TEM imaging.


Thermo Fisher Scientifi c Inc. www.thermofi sher.com


JEM-ARM200F “NEOARM” Atomic Resolution Analytical Electron Microscope


"NEOARM"/JEM-ARM200F comes with JEOL’s unique cold-fi eld emission gun and a new Cs corrector that compensates for higher-order aberrations, enabling atomic-resolution imaging from 200 to 30 kV acceler- ating voltage. “NEOARM” is also equipped with an automated aberration correction system that incorpo- rates JEOL’s new aberration correction algorithm for automatic, fast, and precise aberration correction. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.


JEOL USA, Inc. www.jeolusa.com


Olympus MX63


T e new MX63 and MX63L industrial microscopes are designed for the inspection of large samples. T e MX63 can be used with wafer diameters up to 200 mm and the MX63L with diameters up to 300 mm. T e capabil- ities of the new microscopes include


detecting defects that were diffi cult to fi nd using past observation techniques. T ey also feature a high-intensity white LED light source that maintains image stability such that changes to the light source brightness during viewing do not aff ect the image coloring.


Olympus Corporation www.olympus-lifescience.com


Themis S Transmission Electron Microscope


The Themis S system is Thermo Fisher’s latest addition to the industry-standard Themis TEM platform. Targeted at the needs of semiconductor failure analysis labs working at the sub-20-nanometer technology node, the Themis S system is designed for high-volume semiconductor imaging and analysis and includes an integrated vibration isolation enclosure and full remote operation capability. The DualX x-ray spectrometer is probe-corrected with an 80–200 kV column, automated alignments, and XFEG source. It provides robust, sub-Ångström imaging and fast,


accurate elemental and strain analysis.


Thermo Fisher Scientifi c Inc. www.thermofi sher.com


62 Leica Launches DMi8 S Live Cell Imaging Solution


T e DMi8 S imaging solution from Leica provides 5× more speed and an increased viewing area up to 10,000×. It is combined with the new photomanipulation scanner to activate, ablate, and bleach within one experiment. For super resolution and nanoscopy, the Infi nity TIRF has been added


allowing simultaneous multi-color imaging with single-molecule resolution. T is allows researchers to see more, see faster, and fi nd the hidden, opening up the next chapter in wide-fi eld imaging.


Leica Microsystems www.leica-microsystems.com/dmi8


OXFORD Symmetry® EBSD Detector


Operating at over 3,000 patterns per second, Symmetry is the world’s fastest EBSD detector. With unparalleled sensitivity and dynamic range, Symmetry is ideal for even the most challenging applications, where low beam currents coupled with fast, high-resolution patterns are a necessity. Now there’s no compromise between speed and sensitivity. One detector fi ts all applications: features such as


variable tilt, dynamic calibration, automated setups, and seamless EDS integration ensure that everyone will get the right results every time.


OXFORD Instruments Asylum Research www.oxford-instruments.com


Princeton Instruments Introduces the Fastest and Highest- Resolution 1 M Pixel Electron-Multiplying CCD Camera


Princeton Instruments introduced the fastest and highest-resolution 1 M pixel, 10 μ m 2 pixel EMCCD camera, the ProEM-HS:1KBX3-10μ m. T is addition to the popular ProEM


sensitivity. T e ProEM-HS:1KBX3-10μ m delivers 30 fps at full 1024 × 1024 pixel resolution and <1 e- rms eff ective read noise, all at 36.67 MHz readout speed.


Princeton Instruments www.princetoninstruments.com/products/ProEM-EMCCD


JEOL Announces New Field Emission SEM


JEOL introduced the JSM-7900F scanning electron microscope, a uniquely fl exible platform that combines the ultimate in high-resolution imaging with unparal- leled nanoscale microanalysis. At the heart of this cutting-edge microscope is the new electron optical system, NeoEngine, that signifi cantly enhances alignment accuracy, optimizes probe diameter at all conditions, and simplifi es observation for all levels of


operators. A powerful new navigation system, Smile Navi, guides the operator through the data acquisition process.


JEOL USA, Inc. www.jeolusa.com


doi: 10.1017/S1551929517000724 www.microscopy-today.com • 2017 September eXcelon®3 (X3) fringe-suppression technology to deliver single-photon


product line uses both the latest low-noise readout electronics and Princeton Instruments’ patented


®-HS


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