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Far-Field High-Energy Diffraction Microscopy


Figure 3 : An example of grain map obtained by FF-HEDM from a stainless steel sample. The sample was 1 mm×1 mm in cross section. The wavelength of the X-rays was 0.017286 nm (71.671 keV). The beam size was 2 mm × 0.1 mm (along X L and Y L respectively). The diffraction data were analyzed by MIDAS. The location of each sphere corresponds to the center of mass location of the found grains. Axes are in μ m. Associated with each grain are its crystallographic orientation and lattice strain tensor. (Left) Color shows completeness/confi dence. (Right) Color shows grain radius (m).


Figure 4 : Comparison of the FF-HEDM results for the as-received (AR), irradiated (irr), and irradiated and annealed (irr + ann) samples. (a) Center of mass maps for the AR sample (left), the neutron-irr sample (center), and the irr + ann sample (right). Figures replicated from [ 19 ]. (b) Diffraction spots from single grains in the three samples.


2017 September • www.microscopy-today.com 39


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