June 2-7, 2019


Lehigh University, Bethlehem, PA USA MAIN COURSES


SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS June 3-7


SPECIALIZED COURSES


FOCUSED ION BEAM (FIB): Instrumentation and Applications June 3-7


PROBLEM SOLVING: Interpretation and Analysis of SEM/EDS/EBSD Data June 3-7


QUANTITATIVE X-RAY MICROANALYSIS:


Problem Solving using EDS and WDS Techniques June 3-7


INTRODUCTION TO TEM June 2


TRANSMISSION


ELECTRON MICROSCOPY June 3-7


For more information, contact: Sharon Coe | 610.758.5133 | sharon.coe@lehigh.edu


Register and pay in full by April 12 to receive an early bird discount. www.lehigh.edu/microscopy


49 YEARS OF EXCELLENCE


INTRODUCTION TO SEM AND EDS FOR THE NEW OPERATOR June 2


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