Journal Highlights
Techniques and Material Applications
Reflector Selection for the Indexing of Electron Back-Scatter Diffraction Patterns by SI Wright, S Singh, and M De Graef, Microsc Microanal 25(1) (2019) 1–7 The traditional Hough-based indexing algorithm for EBSD pat-
terns requires a list of ref lectors that will be considered as potential Kikuchi band labels. This list is usually generated using kinematical structure factor values for the crystal structure under consideration. The EBSD pattern, however, is generated by dynamical scattering of back-scattered electrons leaving the crystal, so that structure factor val- ues are not necessarily representative values, in particular for complex unit cells. We have created a new ref lector ranking algorithm, based on integrated intensities of individual bands in dynamically simulated master patterns (see Figure for example stereographic projections of master patterns). For elemental structures, the ranking closely fol- lows the kinematical ranking. However, for more complex structures, the new ranking shows good agreement with a ranking obtained from experimental Kikuchi band intensities determined by means of the Hough transform. Hough-based indexing of a simulated forsterite data set showed an appreciable improvement in the median confidence index (from 0.15 to 0.35) when the new ref lector ranking was used instead of the kinematical ranking.
20 kV master patterns (stereographic projections) for Ni, Si, TiO2 and Mg2SiO4; in all patterns, the crystallographic a axis points
,
horizontally toward the right, and the reciprocal c* axis is normal to the projections.
A top journal in Microscopy
Published for the Microscopy Society of America Editor: John Mansfield, University of Michigan, USA
The only journal owned by scientists and published for scientists, Microscopy and Microanalysis provides original research papers in the fields of microscopy, imaging and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science.
Online submission at
cambridge.org/mam/submit View the journal online at
cambridge.org/mam Microscopy Society of America 2019 July •
www.microscopy-today.com 49
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68
