From the Editor NetNotes, News, and Calendar


In the back of each issue of this magazine there are four regular departments contain-


ing information of general use to the microscopy community: NetNotes, Industry News, Product News, and the Calendar. While these departments are edited by dedicated vol- unteers, the information they contain is largely supplied by the microscopy community itself.


NetNotes are excerpts from the question and answer files of the Microscopy Society of


America’s Microscopy Listserver. Last year this listserver, created and maintained by Nestor Zaluzec, reached its 25th


anniversary making it one of the oldest services of its type. Te


questions asked and answered in NetNotes are oſten about why a procedure or instrument is behaving in a strange way. Typically several experts with experience in the topic offer solu- tions to the problem. Tomas Phillips has produced NetNotes for 18 years, including two years when NetNotes was part of Microscopy and Microanalysis. Industry News provides brief notices about companies and people in the microscopy


community. Product News gives brief descriptions of new microscopy products and provides a website URL where more information can be found. Tis free service allows companies to describe, directly to microscopists, their products and activities. Ron Anderson has been pro- ducing these items from press releases and other sources for 17 years, the first seven of which were when he was the Editor-in-Chief of this publication. Our Calendar is the place to look for notices about future microscopy-related meetings


and courses. It is the most comprehensive microscopy calendar in the world. Meetings related to various fields are listed because certain scientific disciplines have developed specialized specimen preparation and instruments for their needs. Paul Webster has edited the Calendar for nearly a decade. Tom Phillips, Ron Anderson, and Paul Webster together have provided a combined 45


years of service to Microscopy Today and Microscopy and Microanalysis. I greatly appreciate their expertise, diligence, and advice. On behalf of the microscopy community, I say “thank you.”


Charles Lyman Editor-in-Chief


Editorial Staff Charles E. Lyman, Editor-in-Chief


charles.lyman@lehigh.edu (610) 674-7600 Gennifer Levey, Production Manager glevey@meridianartpro.com (212) 780-0315 Ron Anderson, Executive Editor randerson20@tampabay.rr.com Phil Oshel, Technical Editor oshel1pe@cmich.edu Robert Price, Associate Editor bob.price@uscmed.sc.edu Stephen Carmichael, Columnist carmichael.stephen@mayo.edu Eric Clark, Pioneers Editor eclark@magnet.fsu.edu Richard Edelmann, Education Editor edelmare@miamioh.edu Deb Kelly, Microscopy 101 Editor debkelly@vt.edu Thomas E. Phillips, Consulting Editor phillipst@missouri.edu Paul Webster, Calendar Editor p.webster@oak-crest.org John Shields, Humor Editor jpshield@uga.edu Nikolaus Cordes, Digital Content Editor ncordes@lanl.gov Thomas Kelly, Chief Innovation Judge Tomas.kelly@ametek.com Robert Simmons, Chief Micrograph Judge robert.simmons@briarwillow.com


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Magazine website:


http://www.microscopy-today.com Free subscriptions are available


Publication Objective: to provide information of interest to microscopists.


Microscopy Today is a controlled-circulation trade magazine owned by the Microscopy Society of America that is published six times a year in the odd months. Editorial coverage spans all microscopy techniques including light microscopy, scanning probe microscopy, electron microscopy, ion-beam techniques, and the wide range of microanalytical methods. Readers and authors come from both the life sciences and the physical sciences. The typical length of an article is about 2,000 words plus figures and tables; feature articles are longer. Interested authors should consult “Instructions for Contributors” on the Microscopy Today website: www.microscopy-today.com.


ISSN 1551-9295


Disclaimer The Microscopy Society of America and the editors cannot be held responsible for opinions, errors, or for any consequences arising from the use of information contained in Microscopy Today. The appearance of advertising in Microscopy Today does not constitute an endorsement or approval by the Microscopy Society of America of any claims or information found in the advertisements. By submitting a manuscript to Microscopy Today, the author warrants that the article is original or that the author has written permission to use copyrighted material published elsewhere. While the contents of this magazine are believed to be accurate at press time, neither the Microscopy Society of America, the editors, nor the authors can accept legal responsibility for errors or omissions.


© Copyright 2019 by the Microscopy Society of America. All rights reserved.


Publisher Cambridge University Press One Liberty Plaza, 20th Floor New York, New York 10006 (212) 337-5000


Circulation: 18,000


Editorial Board Nasim Alem, Penn State University Arlan Benscoter, Lehigh University John Bozzola, Southern Illinois University Peter Crozier, Arizona State University Vinayak Dravid, Northwestern University David Grubb, Cornell University Bryan Huey, University of Connecticut Heather Lowers, U.S. Geological Survey John Mackenzie, North Carolina State Univ. Paul Maddox, U. of North Carolina–Chapel Hill Ania Majewska, U. Rochester Med School Joseph Michael, Sandia National Labs Caroline Miller, Indiana University Brian M. Patterson, Los Alamos National Lab John Reffner, John Jay College, SUNY Ian Robertson, University of Wisconsin Phillip Russell, Appalachian State University Bradley Thiel, SUNY Polytechnic Institute Simon Watkins, University of Pittsburgh Cynthia Zeissler, Nat. Inst. of Stds. and Tech. (NIST)


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