Microscopy Product Vendors Ted Pella, Inc.
Tel: 800-237-3526 Email:
sales@tedpella.com
www.tedpella.com
High Resolution FE-SEM Sputter and Carbon Coaters
APPLICATIONS: • Life Sciences • Materials Science • Semiconductors • SEM
FEATURES: • Fine-grained, ultra-thin uniform and conformal coating • Wide choice of operating parameters to accommodate all sample types • Purpose designed with optimized vacuum pumping system • Rotary-Planetary-Tilting stage and high resolution thickness controller • Easy to operate with fast cycle times
www.tedpella.com/cressington_html/
Cressington-Introduction.aspx
PELCO BioWave® Pro+ APPLICATIONS: • Microwave Tissue Processing for EM • Light Microscopy • Immunolabeling and Decalcification
FEATURES: User-friendly run screens with live run- time graph • Simplified protocol selection • Report Protocol Manager App and two USB ports for sim- plified data transfer and custom protocol upload
www.tedpella.com/microwave_html/pelco-biowave-pro-plus-microwave-
system.aspx
PELCO® Dimpler™
APPLICATIONS: Materials Science • Semiconductor Failure Analysis • TEM
FEATURES: Precision specimen thinning to near electron transparency at the exact region of interest, increased productivity for thinning compared to ion milling alone, automated operation for ease of use
www.tedpella.com/Material-Sciences_html/
PELCO-Dimpler.aspx
PELCO® Tripod Polisher™ APPLICATIONS: Materials Science • Semiconduc- tor Failure Analysis • TEM • SEM
FEATURES: Simple hand-held precision specimen preparation tool for thinning parallel to plane or angled to plane (wedge polishing) for thinning down to a region of interest or for electron transparency at the wedge tip, is easily used on any rotating metallographic grinder/ polisher that has clear access to the platen surface.
www.tedpella.com/Material-Sciences_html/
PELCO-Tripod-Polisher-590.aspx
PELCO® Precision Lapping Fixtures APPLICATIONS: Precision low deformation cutting of a wide variety of specimen types
FEATURES: PELCO® Lapping Fixtures allow for lapping of samples from <1/8” (3mm) to 1” (25mm) in diameter, and up to 1/2” (13 mm) thick. Micrometer and shim-controlled versions are available. Fixtures are equipped with tungsten carbide feet, which are highly resistant to wear from the lapping process.
www.tedpella.com/Material-Sciences_html/PELCO-Precision-Lapping-
Fixtures.aspx
Companies and their Products
PELCO® Precision Low Speed Saw APPLICATIONS: Compact • multipurpose • low- damage cutting for all specimen types
FEATURES: Its low speed makes it possible to cut frag- ile materials that would otherwise fracture as well as soft materials that would load the diamond wheel on a higher speed saw. A variety of sample holders are available, providing a means for mounting any shape of sample.
www.tedpella.com/Material-Sciences_html/PELCO-Precision-Low-
Speed-Saw.aspx
Metallographic Consumables
APPLICATIONS: Materials Science, Metallography, Petrography, Semiconductor Failure Analysis
FEATURES: Wide selection, good quality, affordable prices.
www.tedpella.com/Material-Sciences_html/
metallography-overview.aspx
PELCO easiGlow™ APPLICATIONS: • Life Sciences • Materials Science • TEM • Tomography
FEATURES: Precise and easy vacuum settings • Short cycle times • Consistent results • Intuitive touch screen for control and display • Supports hydrophilic/ hydrophobic and negative/positive modes
www.tedpella.com/easiGlow_html/
Glow-Discharge-Cleaning-System.aspx
PELCO® Silicon Nitride Support Films and TEM Supplies
APPLICATIONS: • TEM • STEM • Thin Film Research • Life Sciences • Materials Science
FEATURES: Holey SiN films down to 100nm • Solid membrane thickness of 8, 15, 35, 50 and 200nm • 3mm diameter frame fits standard TEM holders • EasyGrip™ edges for improved handling • Variety of window shapes and sizes
www.tedpella.com/grids_html/
silicon-nitride.aspx
PELCO® Modular SEM/FIB Sample Holders and Supplies
APPLICATIONS: • SEM • FE-SEM • FIB • FIB/SEM • CLEM
FEATURES: Stage adapters for all major SEM brands • Large selection of effective and practical sample holders • Correlative microscopy sample holders • Conductive adhesives • Carbon tabs • Conductive tape
www.tedpella.com/SEM_html/
SEM-supplies.aspx
Optical Light Microscopy & SEM Calibration Standards
APPLICATIONS: Calibration Specimens for SEM, TEM, AFM • SPM, FIB, EDS • WDS and Optical Microscopes
FEATURES: X-Ray References Calibration for SEM: PELCO X-CHECKER™ • Pelcotec™ CDMS-XY: Critical Dimension Magnification Standards • AFM Gold Calibration Kit • AFM TipChecker • Magnifica- tion Calibration Calculators • Pelcotec™ LMS-20 G Magnification Calibration Standard • Stage Microm- eters • Fluorescence Reference Slides
www.tedpella.com/calibration_html/
Calibration_Overview.aspx
www.cambridge.org/mto
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