search.noResults

search.searching

saml.title
dataCollection.invalidEmail
note.createNoteMessage

search.noResults

search.searching

orderForm.title

orderForm.productCode
orderForm.description
orderForm.quantity
orderForm.itemPrice
orderForm.price
orderForm.totalPrice
orderForm.deliveryDetails.billingAddress
orderForm.deliveryDetails.deliveryAddress
orderForm.noItems
Company Profile NenoVision


NenoVision is a technology company developing and manufacturing a unique atomic force microscope (AFM) LiteScope™, designed for fast and easy integration into scanning electron microscopes (SEMs). It allows scientists do measurements and analyses, which are normally nearly to impossible, time consuming or very expensive.


MAIN BENEFITS OF AFM-in-SEM SOLUTION


• Complex and correlative sample analysis A unique method of multidimensional correlative imaging (CPEM) enables simultaneous acquisition of the data from SEM and AFM, and their seamless correlation into 3D images. • In-situ sample characterization


Both AFM and SEM measurements are done at the same time, in the same place and under the same conditions, preventing sample contamination, transfer or degradation of sensitive samples.


• Precise localization of the region of interest


An extremely precise and time-saving approach uses SEM to localize and navigate the AFM tip to the region of interest.


AFM-in-SEM CORRELATIVE MICROSCOPY, FUTURE OF NANO-SCALE IMAGING


NenoVision has developed a unique technique for correlative measurements called CPEM™ (Correlative Probe and Electron Microscopy). CPEM enables to simultaneously acquire various AFM and SEM signals covering surface topography, mechanical, electrical, electromechanical and magnetic properties, SE, BSE, and other SEM images. Te CPEM technology allows various AFM and SEM signals to be directly correlated with exceptional precision into 3D images.


PRINCIPAL MEASUREMENT MODES


• Topography (AFM) • Mechanical (Energy Dissipation, FMM, Nanoindentation) • Electrical (C-AFM, KPFM) • Magnetic (MFM) • Electro-mechanical (PFM) • Spectroscopy modes (F-z curves, I-V curves)


MAIN APPLICATION AREAS


• Material science (1D and 2D materials, Steels & metal alloys, Batteries, Ceramics, Polymers & Composites)


• Nanostructures (Modified surfaces FIB/GIS, Quantum dots, Nanostructured films, Nano- patterning, Nanowires, EBIC, ToF-SIM etc.)


• Semiconductors (Integrated circuits, Solar cells, MEMS/NEMS, Failure analyses, Dopant visualization, Current leakage localization)


• Life science (Cell biology, Marine biology, Protein technology) How to find us


NenoVision s.r.o. Purkyňova 649/127 612 00 Brno Czech Republic Tel.: +420 605 287 732 info@nenovision.com https://www.nenovision.com/ LinkedIn: NenoVision (https://www. linkedin.com/company/nenovision/) Facebook: NenoVision (https://www. facebook.com/nenovision/) Twitter: NenoVision (https://twitter.com/ nenovision/)


18


www.cambridge.org/mto


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32  |  Page 33  |  Page 34  |  Page 35  |  Page 36  |  Page 37  |  Page 38  |  Page 39  |  Page 40  |  Page 41  |  Page 42  |  Page 43  |  Page 44  |  Page 45  |  Page 46  |  Page 47  |  Page 48  |  Page 49  |  Page 50  |  Page 51  |  Page 52  |  Page 53  |  Page 54  |  Page 55  |  Page 56  |  Page 57  |  Page 58  |  Page 59  |  Page 60  |  Page 61  |  Page 62  |  Page 63  |  Page 64  |  Page 65  |  Page 66  |  Page 67  |  Page 68  |  Page 69  |  Page 70  |  Page 71  |  Page 72  |  Page 73  |  Page 74  |  Page 75  |  Page 76  |  Page 77  |  Page 78  |  Page 79  |  Page 80  |  Page 81  |  Page 82  |  Page 83  |  Page 84  |  Page 85  |  Page 86  |  Page 87  |  Page 88  |  Page 89  |  Page 90  |  Page 91  |  Page 92  |  Page 93  |  Page 94  |  Page 95  |  Page 96  |  Page 97  |  Page 98  |  Page 99  |  Page 100