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Full-Field MXRF


Acknowledgment T e authors thank Martin Radkte and Uwe Reinholz from Bamline at BESSY for discussions and the Helmholtz Zentrum Berlin (HZB) for the allocation of synchrotron radiation beamtime. Magnus Menzel and Ursula Fittschen thankfully acknowledge the fi nancial support from HZB.


References [1] DM Singer et al ., Environ Sci Technol 43 ( 2009 ) 630 – 36 . [2] S Matsuyama et al ., X-Ray Spectrom 38 ( 2009 ) 89 – 94 . [3] UEA Fittschen and G Falkenberg , Spectrochim Acta Part B 66 ( 2011 ) 567 – 80 .


Figure 9 : Left: Photograph of an iron test sample composed of a 4 μ m thick Fe foil, FeO particles, and Fe 2 O 3 powder. The blue box shows the area that was investigated using the SLcam ® . Right: Result of differential imaging of the iron test sample after 20 min and monitoring the Fe Kα signal at 7,120 and 7,143 eV. Spatial resolution 48×48 μ m 2 . Reprinted from [ 13 ] with permission from the American Chemical Society.


Conclusion


Full-field XRF microscopy using a color X-ray camera is a powerful tool to quickly image large areas (up to about 100 mm2) with spatial resolution from 50 µm to 5 µm. It is ideally suited to non-destructive study of fragile samples, such as those found in cultural heritage research, and for in situ imaging.


[4] O Scharf et al ., Anal Chem 83 ( 2011 ) 2532 – 38 . [5] M Radtke et al ., J Anal At Spectrom 29 ( 2014 ) 1339 – 44 . [6] UEA Fittschen et al ., Spectrochim Acta Part B 99 ( 2014 ) 179 – 84 .


[7] UEA Fittschen and G Falkenberg , Anal Bioanal Chem 400 ( 2011 ) 1743 – 50 .


[8] M Alfeld et al ., AIP Conference Proceedings 1221 ( 2010 ) 111 – 18 .


[9] FP Romano et al ., Anal Chem Oct. 2014 DOI: 10.1021/ ac503263h .


[10] SH Nowak et al ., “Sub-pixel resolution with color X-ray camera Slcam,” arXiv:1501.06825v1 (physics.ins-det) 2015.


[11] MN Boone et al ., L. Nucl Instrum Methods Phys Res Sect. A 735 ( 2014 ) 644 – 48 .


[12] I Reiche et al ., Anal Chem 85 ( 2013 ) 5857 – 66 . [13] P Tack et al ., Anal Chem 86 ( 2014 ) 8791 – 97 .


Scanning Electron Microscopy for the


Life Sciences Heide Schatten


University of Missouri, Columbia US$120.00: Hb: 978-0-521-19599-7: 312 pp


Recent developments in scanning electron microscopy (SEM) have resulted in a wealth of new applications for cell and molecular biology, as well as related biological disciplines. It is now possible to analyze macro molecular complexes within their three-dimensional cellular microenvironment in near native states at high resolution, and to identify specifi c molecu les and their structural and molecular interactions. New approach es include cryo-SEM applications and environmental SEM (ESEM), staining techniques and processing ap plications combining embedding and resin-extraction for imaging with high resolution SEM, and advances in immuno-labeling. With chapters written by experts, this guide gives an overview of SEM and sample processing for SEM, and highlights several advances in cell and molecular biology that greatly benefi ted from using conventional, cryo, immuno, and high-resolution SEM.


New to the Advances in Microscopy and Microanalysis book series! About the series


The Press currently publishes the Microscopy and Microanalysis (MAM) journal in conjunction with the MSA, which reaches 4,000 microscopists and is affi liated with 12 international microscopy societies. The series would be a natural development from this journal, and will take a broad view of the discipline, covering topics from instrumentation to imaging, methodology and analysis across physical science, materials science, biology and medicine. Books commissioned for the series will range from advanced undergraduate textbooks through to research and practitioner oriented monographs for researchers. The series aims to produce a coherent source of material, encouraging the communication and exchange of ideas across these divergent fi elds, ensuring that the series appeals to a broad community in the physical and life sciences.


Forthcoming titles in this series:


Microscopic Nanocharacterization of Materials by Michael Isaacson


Energy Filtered Electron Microscopy and Electron Spectroscopy by Richard Leapman


Dynamic Transmission Electron Microscopy by Nigel Browning, Thomas LaGrange, Bryan Reed, Henning Stahlberg, Bradley Siwick


www.cambridge.org/us 800.872.7423


2015 May • www.microscopy-today.com 43


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