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Volume 24

Number 3

June 2016

table of contents preview

TECHNIQUE AND INSTRUMENTATION DEVELOPMENT Classifi cation of Normal and Apoptotic Cells from Fluorescence Microscopy Images using Generalized Polynomial Chaos and Level Set Function Yuncheng Du, Hector M. Budman, and T omas A. Duever

Quantifying Variability of Manual Annotation in Cryo-Electron Tomograms Corey W. Hecksel, Michele C. Darrow, Wei Dai, Jesús G. Galaz-Montoya, Jessica A. Chin, Patrick G. Mitchell, Shurui Chen, Jemba Jakana, Michael F. Schmid, and Wah Chiu Segmentation Method of Time-Lapse Microscopy Images with the Focus on Biocompatibility Assessment

Jindřich Soukup, Petr Císař, and Filip Šroubek

Picoliter Drop-on-Demand Dispensing for Multiplex Liquid Cell TEM Joseph P. Patterson, Lucas R. Parent, Joshua Cantlon, Holger Eickhoff , Guido Bared, James E. Evans, and Nathan C. Gianneschi

Preparation and Loading Process of Single Crystalline Samples into a Gas Environmental Cell Holder for In Situ Atomic Resolution Scanning Transmission Electron Microscopic Observation. Rainer Straubinger, Andreas Beyer, and Kerstin Volz

Measurement of Trace Constituents by Electron-Excited X-ray Microanalysis with Energy- Dispersive Spectrometry

Dale E. Newbury, and Nicholas W. M. Ritchie

Improving Signal-to-Noise Ratio in Scanning Transmission Electron Microscopy Energy- Dispersive X-Ray (STEM-EDX) Spectrum Images Using Single-Atomic-Column Cross-Correlation Averaging

Jong Seok Jeong, and K. Andre Mkhoyan

Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward Scattered Helium Ions with a Microchannel Plate

Taylor Woehl, Ryan M. White, and Robert Keller

Determining Projections of Grain Boundaries from Diff raction Data in Transmission Electron Microscope

Ákos K. Kiss, and János L. Lábár

Simultaneous SEM Imaging of Topographical and Chemical Contrast using I-L, I-C and Everhart- T ornley Detector Systems

Xinming Zhang, Xi Cen, Rijuta Ravichandran, Lauren Hughes, and Klaus van Benthem Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling Robert Estivill, Guillaume Audoit, Jean-Paul Barnes, Adeline Grenier, and Didier Blavette


T e Eff ect of Electron Beam Irradiation in Environmental Scanning Transmission Electron Microscopy of Whole Cells in Liquid

Justus Hermannsdörfer, Verena Tinnemann, Diana B. Peckys, and Niels de Jonge Nucleologenesis in Trypanosoma cruzi

Tomás Nepomuceno-Mejía, Reyna Lara-Martínez, Roberto Hernández, María de Lourdes Segura-Valdez, and Luis Felipe Jiménez-García

Collagen Fibril Ultrastructure in Mice Lacking Discoidin Domain Receptor 1 Jeff rey R Tonniges, Benjamin Albert, Edward Calomeni, Shuvro Roy, Joan Lee, Xiaokui Mo, Susan Cole, and Gunjan Agarwal

Eff ects of Pamidronate on Dental Enamel Formation Assessed by Light Microscopy, Energy-Dispersive X-Ray Analysis, Scanning Electron Microscopy, and Microhardness Testing Ana Prates Soares, Renan Fernandes do Espírito Santo, Sérgio Roberto Peres Line, Maria das Graças Farias Pinto, Pablo de Moura Santos, Maria Betânia Pereira Toralles, and Alexandre Ribeiro do Espírito Santo

Analysis of Counterfeit Coated Tablets and Multi-Layer Packaging Materials using Infrared Microspectroscopic Imaging

Taryn L. Winner, Adam Lanzarotta, and André J. Sommer MATERIALS APPLICATIONS

Characterization at Atomic Resolution of Carbon Nanotube/Resin Interface in Nanocomposites by Mapping sp2 Bonding States using EELS

Yi-Feng Su, Jin Gyu Park, Ana Koo, Sarah Trayner, Ayou Hao, Rebekah Downes and Richard Liang

Structural Investigation of AlN/SiOx Nanocomposite Hard Coatings Fabricated by Diff erential Pumping Cosputtering

Masahiro Kawasaki,Masateru Nose, Ichiro Onishi, and Makoto Shiojiri

Aberration-Corrected Scanning Transmission Electron Microscope (STEM) T rough-Focus Imaging for T ree- Dimensional Atomic Analysis of Bismuth Segregation on Copper [001]/33° Twist Bicrystal Grain Boundaries

C. Austin Wade, Mark J. McLean, Richard P. Vinci, and Masashi Watanabe Textural and Mineralogical Analysis of Volcanic Rocks by μ-XRF Mapping Luigi Germinario, Roberto Cossio, Lara Maritan, Alessandro Borghi, and Claudio Mazzoli


Density Functional T eory Modeling of Low-Loss Electron Energy-Loss Spectroscopy in Wurtzite III-Nitride Ternary Alloys

Alberto Eljarrat, Xavier Sastre, Francesca Peiró, and Sónia Estradé

A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: Philip Ewels, T ierry Sikora, Virginie Serin, Chris P. Ewels, and Luc Lajaunie Microstructural Characterization of Aluminum-Carbon Nanotube Nanocomposites Produced Using Diff erent Dispersion Methods

Sónia Simões, Filomena Viana, Marcos A. L. Reis, and Manuel F. Vieira 2016 May • doi: 10.1017/S1551929516000262 73 Dear Abbe,

An ongoing hair-pulling dispute continues between me, the microscopist, and, like, almost every fraternity/sorority member doing research: “Why do you take so many images for each sample? Wouldn’t, like, 2 or 3 pictures be just as good as the 5 to 10 you took? I [the investigator] still like totally can’t get over you embedding 6 blocks and sectioning all those blocks as semi-things!” How do you handle this scenario? How do you demonstrate that more in EM is actually better!? Alopecic in Amherst

Dear Hairless,

Once upon a time, in a land far, far away, there were many smart people who pondered, “How much is too many, and what are we doing in these ridiculous lab coats?” We got together to discuss this at long-winded meetings that included alcoholic beverages and decided that lab coats were cool. Especially lab coats with many pockets and an impressive logo on the upper leſt . We also realized that there can be many potential images to be created by sample processing, just as there are many versions of Shakespeare by Hairy Monkeys. Also, depending on your state of consciousness while preparing the samples and mounting, you could have created many alternative realities, but which samples were real? To decide this, we invented photomi- crography so we could study the results later in a local Kneipe. T en we had to decide how many samples we had to look at, and just what was a “sample” anyway. T is made the Zöllner happy, and we eventually came up with the only correct answer: Lots! So be reassured that you are following in the footsteps of great microscopists: me and a few others.

Dear Abbe,

I think the gold-palladium target on my sputter coater might be getting close to needing a replacement. How can I be sure?

Cautious in Caracas

Dear Cautious, Hasenpfeff er! It’s usually not that hard. Once you notice that seeing the purple haze requires more mind-altering drugs (my method of choice), then it’s probably time. The other alternative sounds quite sketchy (and probably illegal in Kansas) as suggested by Fred Monson in the Microscopy Listserver. It required gloves, a dark room, a viewing apparatus, and something about an “anulus.”

No one likes to be caught with their equipment in disrepair, or holes in their excuses! Need a good scapegoat or viable story? Herr Abbe can provide some doozies. Just contact his questionably sane assistant at to have him give it a try.

Dear Abbe

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