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NetNotes


We have SIS MegaView II 16 years old, even older then yours Megaview III. Well, we used to record the correction images quite frequently, approximately once per month or two. As the CCD chip and scintillator were getting older, the interval for “shading correction” adjustment had to be shorter. Aſt er 15 years, we had to record every week a new set of gain and bias images. You can quite easily check whether you need to perform new adjustment of “shading correction” or not. 1. Take-off the sample holder out of the column 2. Adjust the illumination on the screen 3. Insert camera 4. Adjust beam intensity to ~50% 5. Take an image. Now measure the histogram of “Gray value distribution” in the recorded image (Main menu: Measure -> Histogram). Look at the course of the histogram line. If it is smooth and the distribution is narrow (~100 for MegaView II is OK) then you do not need to adjust “shading correction”. Otherwise you should take a new set of gain and bias images. Oldrich Benada benada@biomed. cas.cz T u Feb 18


ESEM:


live image to external computer T ere is a video out BNC on the back of the FEI Quanta 200 ESEM. In Low Vac mode, I can see the signal when connecting to an external view monitor. T e signal is horizontal lines that change in size and number when I change image resolution or scan speed. Also B/C seems to adjust normally. What can I do to make this into a usable image signal to use for internet teaching outreach project? Is there a better way to get the SEM signal to the internet? Wallace Ambrose wambrose@ unc.edu Wed Feb 10


You can use Team Viewer or VNC to directly share desktop of your SEM with remote computer(s). If you want to grab video from BNC then decent video grabber card and some coding/confi guring


may be needed. I’ve used Epiphan PCIe in the past, though not with the FEI E-SEM that you have: http://www.epiphan.com/products/ dvi2pcie-duo/ Valery Ray vray@partbeamsystech.com T u Feb 11


EDX:


strange performance at very low count rates One or two of my users have observed a strange behavior on our FEI Talos F200X (FEI SuperX detector, Bruker pulse processor, Bruker soſt ware). I’m not going to call this an “error” or a “fault,” just something strange. Hopefully the list’s hive minds can reality check me. Let’s say that on a very thin, low-Z sample, 400 pA might give 400 counts / sec on each of the four detectors (as seen in the TIA SuperX tab). 300 pA might give 300 cps. 200 pA might give zero. (Numbers are approximate.) I interpret this to mean that there is a low-end discriminator on the pulse processor or soſt ware somewhere, and below a certain count rate no counts are registering. Is this possible? Is there a setting I can drill down to in order to let my users push to lower beam currents on their beam-sensitive samples? T is isn’t a common problem—most of my Talos users are running ~5 nA, ~200 kcps beautifully—but I want to help all my users, not just those who can use the STEM as an electron sledgehammer. Chad Parish parishcm@ornl.gov T u Jan 28 We have a JEOL X-ray detector with a T ermo Pulse-processor


and soſt ware and we can go way down in beam current to still collect X-rays. On a recent trip our engineer showed me a soſt ware switch to remove the “noise” peak counts from the spectrum and the reported count rate. But if you are literally not seeing any peaks with 200pA then there’s a fundamental problem - call Bruker at once. Rob Keyse rok210@lehigh.edu T u Jan 28


Scanning Electron Microscopy for the


Life Sciences Heide Schatten


University of Missouri, Columbia US$120.00: Hb: 978-0-521-19599-7: 312 pp


Recent developments in scanning electron microscopy (SEM) have resulted in a wealth of new applications for cell and molecular biology, as well as related biological disciplines. It is now possible to analyze macro molecular complexes within their three-dimensional cellular microenvironment in near native states at high resolution, and to identify specifi c molecu les and their structural and molecular interactions. New approach es include cryo-SEM applications and environmental SEM (ESEM), staining techniques and processing ap plications combining embedding and resin-extraction for imaging with high resolution SEM, and advances in immuno-labeling. With chapters written by experts, this guide gives an overview of SEM and sample processing for SEM, and highlights several advances in cell and molecular biology that greatly benefi ted from using conventional, cryo, immuno, and high-resolution SEM.


New to the Advances in Microscopy and Microanalysis book series! About the series


The Press currently publishes the Microscopy and Microanalysis (MAM) journal in conjunction with the MSA, which reaches 4,000 microscopists and is affi liated with 12 international microscopy societies. The series would be a natural development from this journal, and will take a broad view of the discipline, covering topics from instrumentation to imaging, methodology and analysis across physical science, materials science, biology and medicine. Books commissioned for the series will range from advanced undergraduate textbooks through to research and practitioner oriented monographs for researchers. The series aims to produce a coherent source of material, encouraging the communication and exchange of ideas across these divergent fi elds, ensuring that the series appeals to a broad community in the physical and life sciences.


Forthcoming titles in this series:


Microscopic Nanocharacterization of Materials by Michael Isaacson


Energy Filtered Electron Microscopy and Electron Spectroscopy by Richard Leapman


Dynamic Transmission Electron Microscopy by Nigel Browning, Thomas LaGrange, Bryan Reed, Henning Stahlberg, Bradley Siwick


www.cambridge.org/us 800.872.7423


64 www.microscopy-today.com • 2016 May


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