64 MICROSCOPY
Micro-Raman is a micro- technique, but when AFM is added, it becomes a nano-technique. It allows the AFM structural data to be recorded online and improves the resolution of the Raman information when the nanometric feedback of the system adjusts, with unprecedented precision, the position of each pixel of the sample relative to the lens. Also the small movements of the AFM stage provide oversampling which is a well-known technique for resolution improvement.
One integrated AFM-Raman system developed by Nanonics Imaging Ltd, in association with major Raman manufacturers such as Renishaw plc, Horiba JY and others, provides simultaneous and, very importantly, on-line data from both modalities. Tis advantage addresses critical problems in Raman including resolution and intensity comparisons in Raman
images while permitting on-line functional characterisation such as thermal conductivity, elasticity and adhesion, electrical and other properties.
Te Nanonics platform can be used for structural and photonic characterisation, as well as the structural and chemical characterisation that is available with AFM and Raman integration.
For these applications, Nanonics Imaging is the innovator of AFM and NSOM systems, including dual tip/sample scanning AFM systems, the industry’s first NSOM-AFM cryogenic systems, integrated Raman-AFM systems, multi-probe AFM and SEM- AFM systems. Te company also holds patents to the largest range of unique nano-probes. Tese probes form a NanoToolKit for its unique characterisation platforms with a variety of tasks, such as for nano-photonics, plasmonics, nano-chemical
imaging and even nano-chemical deposition based on its singular NanoFountainPen technology. Te company is focused on full integration of AFM technology with optics, chemical imaging and other analytical tools.
Te Nanonics MultiView AFM- NSOM microscope, with its free optical axis on a standard micro- Raman, now makes it possible to integrate the separate worlds of Raman and AFM/NSOM nanocharacterisation, which has led to a new era in high- resolution Raman spectroscopy.
Facilitating this integration is not only the geometry of the AFM/NSOM platform but also a new generation of AFM glass probes that have very unique characteristics – such as hollow glass probes with cantilevered nano-pippets for material deposition, probes with glass surrounding a single nano-wire in the middle for ultrasensitive electrical measurements, or dual
wire glass probes for thermal conductivity and thermocouple measurements. Glass probes are ideal for Raman integration because of their transparency to laser light and no Raman background.
Underlying this integration of AFM with micro-Raman is negative-stiffness vibration isolation, developed my Minus K Technology Inc. What negative-stiffness isolators provide is unique to SPM- Raman and other NSOM systems. In particular, improved transmissibility of a negative- stiffness isolator – that is the vibrations that transmit through the isolator relative to the input floor vibrations. Transmissibility with negative-stiffness is substantially improved over air systems and over active isolation systems.
Jim McMahon writes on instrumentation
technology. Nanonics Imaging Ltd is based in Jerusalem, Israel.
www.nanonics.co.il
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