Determine Reflectance, Film Thickness and Refractive Index with NanoCalc-XR
The NanoCalc Series are part of the Mikropack product line of thin film metrology systems. The NanoCalc systems are versatile and configurable thin film measurement systems utilising spectroscopic reflectometry to accurately determine optical and non-optical thin film thicknesses for consumer, semiconductor, medical and industrial applications in a wide range of fields.
Features » Resolution to 0.1 nm » Can measure up to 10 layer stacks » Refractive index » Sophisticated algorithms enable defect and roughness tolerant measurements
» Large database to ensure accuracy over a broad range of materials
» Adaptors for complex geometries and accessories for thickness mapping
Applications » Transmission and reflection measurements of anti-reflective & hardness coatings
» Analysing medical coatings and catheter balloon foils
» Testing hardness and wear coatings » Measuring thickness of thinned silicon wafers » Determining photo resists for masks » Analysing coatings applied for weather or dirt resistance (Lotus Effect)
» Measuring coatings inside drinks containers » Air gap measurements » Optical disk coating analysis (CD, DVD, ... )
Contact us today for more information about this versatile and configurable thin film measurement system or visit us at one of the upcoming shows:
Ocean Optics Germany GmbH Thin Film Metrology Centre Maybachstrasse 11 D-73760 Ostfildern
T: +49 711 34 16 96-0 F: +49 711 34 16 96-85
thinfilm@oceanoptics.eu www.oceanoptics.eu
Visit stand 1.511 at: Visit stand D24 at: 11-13 October 2011
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