Analysis, test and measurement Wavelength meter
Toptica has released the HighFinesse WS6-200 IR3 wavelength meter, providing precise and fast wavelength measurement in the mid-infrared (IR). This system performs measurements in a wavelength range from 2-11μm. Like all other wavelength meters of the HighFinesse/Ångstrom series, the WS-200 IR3 accomplishes wavelength measurements with high accuracy and high speed. Both CW and pulsed lasers with narrow-band emission can be examined, monitored and even controlled. Based on a rugged Fizeau interferometer setup without any moving components, the
touch-screen power/energy monitor
Gentec Electro-Optics has launched its maestro laser power and energy monitor, the company’s first device to feature full touch-screen controls. Based on a 5.6-inch colour LCD screen, the device is designed for ease of use and accessibility. The maestro allows data transfer and storage directly from the device using a USB key, while also offering Ethernet, RS-232, analogue output, external trigger and a USB com port for sending serial commands via a PC
www.gentec-eo.com
imaging photometer
The Life Sciences and Instrumentation division of Gooch & Housego (formerly Optronic Laboratories, based in Orlando, Florida, USa) has become the North american distributor of the LmK imaging photometer (luminance measuring camera) systems manufactured by TechnoTeam Bildverarbeitung (Germany). The LmK series of imaging photometers
and innovative user-driven application software is suitable for a wide variety of light measurement applications. Coupled with TechnoTeam’s integrated automated goniometer, it can be used for near-field measurements of angular and spatial distribution of extended sources in high growth applications – such as LED luminaires and automotive lighting, otherwise impossible in test facilities where space is at a premium. www.gooch
andhousego.com/products/ systems
wavelength meters provide best performance even under harsh conditions. The extremely sensitive detector allows for high-speed data processing algorithms and enables single-pulse measurements up to a repetition rate of 150Hz. a fibre input port for coupling the laser radiation into the wavelength meter ensures convenient handling. The device is computer-controlled via a fast USB interface. Fully automated
long-term measurements can be recorded and data can be converted to different formats for subsequent evaluation, e.g. to assess the long- term frequency stability of a laser system.
www.toptica.com
M2
laser beam propagation analyser
Ophir Photonics has introduced its NanomodeScan m2
laser beam propagation
analyser, enabling quantitative measurement and viewing of high power CO2
laser beams. The
system is easy to setup and align; the straight line of sight design means little or no attenuation is required. NanomodeScan is also fast; an m2
measurement can be made
in as little as 20 seconds. In addition, the system reports beam waist diameter and location, divergence, and the beam’s Rayleigh range for each axis. The NanomodeScan’s ease of use and fast update rate (up to 20Hz) make it ideal for CO2
laser-based material processing, machining, and marking applications where
laser performance needs to be adjusted in real time. The NanomodeScan m2
combines the
flexibility and speed of Photon Inc’s NanoScan near-field profiler with dedicated m2 measurement hardware and software. The system provides automated measurement of m2
either the
ISO 11146 or Rayleigh method. It reports such parameters as m2
times diffraction limit, K
beam propagation factor, d0 beam waist size, Z0 beam waist
location, ø divergence, and Zr Rayleigh range. The system’s software controlled variable scan speed allows the measurement of both CW and kHz pulsed lasers.
www.ophiropt.com/photonics
50
ElEctro optics l may 2011
www.electrooptics.com
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