From the Editor World’s Largest Microscopy Exhibition
T e upcoming Microscopy & Microanalysis 2011 meeting in Nashville will
include the world’s largest annual exhibition of microscope equipment, supplies, and services. For most attendees, the exhibition is one of the highlights of the M&M meeting. T is extraordinary exhibition has a long history. T e Microscopy Society of
America was founded in 1942 at a meeting of about 60 electron microscopists in Chicago. At this meeting RCA set up a TEM in the hotel, but they didn’t manage to get it working. Since then, there has been an exhibition of microscopes at nearly every annual meeting. By contrast to that fi rst exhibition, at the 2005 Honolulu meeting FEI set up the fi rst production model of an aberration-corrected TEM—and it worked! T e M&M exhibition has grown over the years and attracts exhibiting companies from all over the world. In 1984 there were 45 companies exhibiting. In 2010, 108 companies exhibited. Each year companies use the M&M exhibition to launch new products, give
demonstrations, and provide tutorials about microscopy methods. T e exhibition allows buyers of microscopes to compare instruments at the largest microscope marketplace. T e exhibition hall is also the location of the aſt ernoon poster events and a great place to meet friends from all disciplines. Our exhibitors are more important to MSA and the M&M meeting than just
commercial participants. Many of our exhibitors are also MSA Sustaining Members or MAS Sustaining Members, who support our societies throughout the year. At the annual Sustaining Members Breakfast, company representatives have off ered advice to help improve the operation of the M&M meeting. T e comments, suggestions, and support of our exhibitors and Sustaining Members have materially improved our exhibition year-by-year. On behalf of MSA and MAS, I thank these companies and institutions for their support. So come to the exhibition: have lunch, meet vendors, view posters, and renew
friendships from across the microscopy community. My thanks to Mike Marko and Doreen Bonnnema, who supplied data for this editorial.
Charles Lyman Editor-in-Chief
Publication Objective: to provide information of interest to microscopists.
Microscopy Today is a controlled-circulation trade magazine owned by the Microscopy Society of America that is published six times a year in the odd months. Editorial coverage spans all microscopy techniques including light microscopy, scanning probe microscopy, electron microscopy, ion-beam techniques, and the wide range of microanalytical methods. Readers and authors come from both the life sciences and the physical sciences. The typical length of an article is about 2,000 words plus fi gures and tables; feature articles are longer. Interested authors should consult “Instructions for Contributors” on the Microscopy Today website:
www.microscopy-today.com.
ISSN 1551-9295
Disclaimer The Microscopy Society of America and the editors cannot be held responsible for opinions, errors, or for any consequences arising from the use of information contained in Microscopy Today. The appearance of advertising in Microscopy Today does not constitute an endorsement or approval by the Microscopy Society of America of any claims or information found in the advertisements. By submitting a manuscript to Microscopy Today, the author warrants that the article is original or that the author has written permission to use copyrighted material published elsewhere. While the contents of this magazine are believed to be accurate at press time, neither the Microscopy Society of America, the editors, nor the authors can accept legal responsibility for errors or omissions.
© Copyright 2011 by the Microscopy Society of America. All rights reserved.
Editorial Staff
Charles E. Lyman Editor-in-Chief
charles.lyman@
lehigh.edu (610) 758-4249
Gennifer Levey, Production Manager
glevey@meridianartproduction.com (212) 780-0315
Ron Anderson, Executive Editor
microscopytoday@tampabay.rr.com
Phil Oshel, Technical Editor
oshel1pe@cmich.edu
Stephen Carmichael, Columnist
carmichael.stephen@
mayo.edu
Michael Davidson, Pioneers Editor
davidson@magnet.fsu.edu
Steven Barlow, Education Editor
sbarlow@sunstroke.sdsu.edu
Thomas E. Phillips, Consulting Editor
phillipst@missouri.edu
E. Ann Ellis, Microscopy 101 Editor
eann.ellis@worldnet.att.net
Paul Webster, Calendar Editor
pwebster@usc.edu
John Shields, Humor Editor
jpshield@uga.edu
Advertising Sales M.J. Mrvica Associates, Inc. 2 West Taunton Avenue, Berlin, NJ 08009
mjmrvica@mrvica.com (856) 768-9360
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Magazine website:
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Publisher Cambridge University Press 32 Avenue of the Americas New York, NY 10013-2473 (212) 337-5000
Circulation: 16,400 Editorial Board
Arlan Benscoter, Lehigh University John Bozzola, Southern Illinois University Peter Crozier, Arizona State University Vinayak Dravid, Northwestern University Joseph Goldstein, University of Massachusetts Bryan Huey, University of Connecticut Thomas Kelly, Imago Corporation John Mackenzie, North Carolina State Univ. Paul Maddox, University of Montreal Ania Majewska, U. Rochester Med School Greg Meeker, U.S. Geological Survey Joseph Michael, Sandia National Labs Caroline Miller, Indiana University Robert Price, University of South Carolina John Reffner, John Jay College, SUNY Ian Robertson, University of Illinois Phillip Russell, Appalachian State University Glenn Shipley, Citizen Microscopist Robert Simmons, Georgia State University Paul Voyles, University of Wisconsin Simon Watkins, University of Pittsburgh Cynthia Zeissler, Nat. Inst. of Sci. and Tech. (NIST)
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