ProductNews
rIQ™—The Smart Way to Determine the Refractive Index of Glass Trace Evidence
CRAIC Technologies, Inc. joins with Laboratory Imaging, s.r.o., to introduce rIQTM (Refractive Index Quantification): the intelligent solution for the analysis of glass trace evidence. rIQTM is the result of a collaboration between CRAIC Technologies and Laboratory Imaging. rIQTM combines sophisticated image analysis soſtware, advanced optical design, and electronics to enable criminalists in modern forensic laboratories
to measure the refractive index of multiple glass fragments simultaneously, quickly, and with the highest accuracy.
CRAIC Technologies, Inc
www.microspectra.com
Automated UV-visible-NIR Spectroscopy of Microscopic Features with the 20/20 PV™
CRAIC Technologies introduces the automated version of its 20/20 Perfect VisionTM UV-visible-NIR microspectrophotometer. Tis system is designed to be fully programmable with touchscreen controls so that it can automatically analyze microscopic samples with UV-visible-NIR spectroscopy and microscopy. Imaging and spectroscopic analysis of samples can be
done by absorbance, reflectance, and fluorescence from the deep UV to far into the near infrared.
CRAIC Technologies, Inc.
www.microspectra.com
JEOL Cold FEG TEM Enables “Flash & Go”TM
Te JEOL ARM200F TEM with Cold Field Emis- sion Gun offers higher brightness and narrower energy spread for ultra-high imaging resolution of 78 picometers with an energy resolution of better than 0.3 eV. Unique “Flash & Go”TM capability allows the user to resume observation and analysis just seconds aſter a flash. A newly developed
vacuum system evacuates the area around the Cold FEG source to the order of 1 × 10–9 Pa, resulting in unprecedented emission stability.
JEOL USA
www.jeolusa.com
QED for DigitalMicrograph
HREM Research Inc. released QED (Quantitative Electron Diffraction) that was introduced at IMC17 in Rio, Brazil. QED is a patented procedure developed by Christoph Koch at the Max Planck-Institute for Metals Research, Stuttgart, Germany, to acquire
Large-Angle Rocking-Beam Electron Diffraction (LARBED) and/or Precession Electron Diffraction (PED) patterns by controlling the tilt angle and position of a collimated electron beam. Compensating the beam shiſt induced by aberrations of the illumination system enables QED to collect electron diffraction data from nano-sized samples.
HREM Research Inc
www.hremresearch.com
2011 May •
www.microscopy-today.com
JEOL USA
www.jeolusa.com
Optical MEMS Scanning Micromirrors Smaller, Faster, More Robust and Less Power-Consuming Than Conventional Optical Scanning Systems
Lemoptix silicon-based, magnetically actuated MEMS micromirror technologies are best-in-class replacement solutions to traditional galvanometer and rotating mirrors, bringing outstanding perfor- mance and space reduction. Te company has developed a unique expertise in the areas of the mechanical and electrical design of MEMS scanning mirrors, magnetic actuation optimization, and mirror optical properties. Lemoptix micromirrors, made of single- crystal silicon, demonstrate very high robustness and long-term stability.
Lemoptix in North America
www.merictech.com/micromirrors.htm
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Innovative Radiometer/Photometer with Interchangeable Sensors
Spectronics Corporation has introduced the AccuMAXTM Series of digital radiometers/ photometers, which provide accurate readouts for UV irradiance, visible illuminance, and luminance light readings.
Te readout units are specially calibrated for use with a full line of interchangeable sensor detectors. When equipped with a sensor detector, the AccuMAX readout unit can satisfy nearly any laboratory or life science application, including fluorescent inspection and UV dosing. Single-wavelength sensor detectors are available in both standard range and extended range.
Spectronics Corporation
www.spectroline.com
EDAX Introduces Apollo XlT SDD Series for Transmission Electron Microscope
EDAX Inc. has released the Apollo Silicon Driſt Detector (SDD) Series for TEM. Te new series includes the Apollo XLT with a Super Ultra Tin Window (SUTW) and the Apollo XLTW, a windowless version. Te Apollo XLT SDD Series
offers superior collection efficiency with a uniquely designed 30-mm2 sensor for TEM applications. Te windowless version further maximizes the collection efficiency and improves sensitivity up to 500% for low-energy X-rays.
EDAX, Inc.
www.edax.com
Navigation System for SEM and EPMA
JEOL offers a new point-and-shoot sample navi- gation system that makes finding precise areas of interest on a sample both fast and easy for SEM and EPMA users. Te Sample Navigation System combines Stage Navigation Soſtware with an exter- nal digital camera that eliminates the need for a dedicated port and can serve as a hub for multiple
instruments. Te user simply records an image of the sample and then navigates to the precise stage location.
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