Volume 19 Number 3 2011 May


Feature Article Contents


10 Still “Plenty of Room at the Bottom” for Aberration-Corrected TEM Joerg R. Jinschek, Emrah Yucelen, Bert Freitag, Hector A. Calderon, and Andy Steinbach


Instrumentation


16 Low-Cost, Atmospheric-Pressure Scanning Transmission Electron Microscopy Niels de Jonge, Elisabeth A. Ring, Wilbur C. Bigelow, and Gabriel M. Veith


22 A Design-of-Experiments Approach to Characterizing Beam-Induced


Deposition in the Helium Ion Microscope Larry Scipioni, Colin Sanford, Emile van Veldhoven, and Diederik Maas


28 Use of the Rise Distance Method to Measure Beam Size of a FIB J. Orloff and L. Roussel


Microanalysis


34 Manipulating Spectra with DTSA-II Nicholas W. M. Ritchie


40 Evaluating the Performance of a Commercial Silicon Drift Detector


for X-ray Microanalysis Edward A. Kenik


Microscopy Education About the Cover


48 Augmenting Secondary Education with Advanced Microscopy Craig Queenan, Alyssa Calabro, and David Becker


Microscopy Pioneers


54 Pioneers in Optics: Joseph Jackson Lister and Maksymilian Pluta Michael W. Davidson


Departments


7 Editorial 8 Carmichael’s Concise Review


Experimental exit wave phase images of graphene sheets. Width of image at lower right = 2.73 nm.


See article by Jinschek et al.


58 Industry News 60 Product News 62 NetNotes


68 Calendar of Meetings 71 Dear Abbe 72 Opinion Graham Cliff


74 Index of Advertisers


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