ENCLOSURES
New Challenges for Test and Measurement Systems
Alan Cook, Foremost Electronics considers requirements for system architecture and enclosure solutions
T
here are growing requirements for simulation, test, and measurement tasks which are changing the requirements for enclosure and cabinet solutions. This concerns the system architecture with factors such as high computing power, fast data transfer, more accurate synchronisation of individual components (clock and trigger functions), etc., as well as requirements for mechanical properties such as improved EMC shielding, superior signal integrity, improved cooling, and suitable configurations and platform-based developments for the modularity of test and measurement systems.
Depending on the application, it is important to choose a system architecture that provides the desired properties and interfaces. In the area of test and measurement applications, there are multiple standardised system architectures acceptable for building corresponding systems. In addition, corresponding mechanical requirements must be taken
into account, depending on the application.
Versatile applications of PXI Express
PXI Express systems are suited for the tough requirements in simulations for autonomous driving, on test stands for function tests in the area of civil and military aviation technology, and for product tests of consumer electronics during the production process. Such complex products require test systems with a high data throughput and extremely precise clock and trigger signals for synchronising the functions of the test object. These devices can be easily integrated into IIoT networks and offer enough data bandwidth to connect and synchronise the test devices to and with the rest of the production line. Additionally, detailed data is transferred for quality management as well as for documentation. Thanks to its fast data transfer rates with PCIe, paired with the implemented high- precision clock and trigger architecture,
34 DECEMBER/JANUARY 2023 | ELECTRONICS TODAY
which synchronises the cards with each other, PXI Express is very suitable for such test, measurement, and simulation tasks.
System architecture and mechanical systems
PXI Express is an updated PXI platform and provides the user with the widely adopted PCI Express bus. PXI Express is based on the widespread 19” form factor and offers backwards compatibility with the proven PXI. PXI Express has PCIe Gen3 with up to x8 links and supports a system bandwidth of up to 24GB/s for acquiring and evaluating simulated and measured data. A sophisticated clock and trigger architecture supports synchronisation of the measured data. Backwards compatibility with PXI-1 enables access to a variety of dedicated measurement and test cards. The PCI Express bus is expanded by one or more PCI Express switches to enable a larger measurement system with more than four slots. A PCIe-to-PCI bridge is required to
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