FlexSEM 1000 II VP-SEM


Compact Design with Full-size Performance


 Multi-zigzag for Ultra-wide Area Observation  User-friendly Operation 


UVD and Hitachi map 3D Capability  Variable Pressure for Sensitive Samples Request a virtual demo at microscopy@hitachi-hta.com


HT7800 120 kV TEM


Redefine the boundaries of 120 kV TEM with modern technology


Regulus8230 UHR FE-SEM


Experience the industry standard for ultra-high-resolution SEM


SU7000 UHR Analytical FE/VP-SEM


Elevate research and analysis to the next level with this ultra-high- resolution Schottky SEM


SU3800/3900 VP-SEM


Analyze large and heavy samples with ease using this revolutionary VP-SEM featuring IFT


AFM5300E Environmental SPM


Analysis from all angles with surface, structure, and even correlative EM


ArBlade 5000 Ion Milling System


Better sample preparation leads to better SEM images with our innovative ion milling systems


www.hitachi-hightech.com/us Tel. 800-253-3053


E-mail: microscopy@hitachi-hta.com © 2019 Hitachi High-Tech America, Inc. All rights reserved.

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