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Preparation of Cross Sections of Diffi cult Materials for SEM Imaging Scott A. Payne and Jayma A. Moore


Electron Microscopy Center Core Facility , North Dakota State University , NCSL , 1605 Albrecht Blvd , Fargo , North Dakota 58102


* jayma.moore@ndsu.edu


Abstract : Preparing cross sections of particulates and wires for scanning electron microscopy study without inducing mechani- cal damage is difficult. Embedding materials in commercially available epoxy before polishing with a broad unfocused ion beam is a simple and inexpensive way to produce a cross section with minimal preparation artifacts. A stepwise procedure is provided for embedding and polishing powders, larger particles, and wires.


Keywords : scanning electron microscopy (SEM), cross section, powder, embedding, argon beam, polishing


Scanning electron microscopy (SEM) is a versatile tool to reveal the microstructures inside objects. To better observe these contents, cross sections of the specimen are often produced. When a cross section is needed, damage prevention can be particularly challenging. Cross sections may be prepared simply, for example by cutting with a razor blade or scissors. This method is easy and economical, but it can introduce significant artifacts by crushing the structure or leaving noticeable tool marks on the prepared edge.


More complex preparation methods (for example, freeze- fracture, microtomy, mechanical polishing) can be difficult, unpredictable, time-consuming, and expensive—even then the face of the cross section may not be clean and damage- free, particularly with easily deformable materials or mixed hard-and-soft materials.


Argon-beam polishers have been available commercially for at least a decade [ 1 ] from several manufacturers including JEOL Ltd., Gatan Inc., Hitachi High-Technologies Corp., and Fischione Instruments, Inc. By using a broad unfocused beam of argon ions, these devices create a highly polished cross section with minimal distortion [ 2 ]. T is polishing technique does have some drawbacks, including limitations on sample size, sample heating in the argon beam, and diffi culty holding or orienting materials such as fi ne powders, irregularly shaped items, and small wires. T is article describes a method to help resolve the latter problem.


Figure 1 : Stepwise procedure for embedding a powdered substance in two-part epoxy for cross-sectional polishing. (A) Dispense epoxy components onto cardboard. (B) Mix thoroughly. (C) Apply powder to surface of epoxy on PTFE sheet. (D) Cut Aclar ® to use as a cover. (E) Press Aclar ® gently into epoxy. (F) Remove cured epoxy containing powder sample.


40 doi: 10.1017/S1551929518000500 www.microscopy-today.com • 2018 May


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