Experience the ETHOS Where High-Performance Imaging Meets Nanoscale Precision Processing


The Hitachi ETHOS NX5000 FIB-SEM incorporates the latest-generation field-emission technologies with unmatched beam brightness and stability to achieve high-resolution imaging as well as high-quality elemental analysis even at low acceleration voltages. Equipped with cutting-edge ion optics, the ETHOS makes nanometer-scale processing a breeze.


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Focused Ion and Focused Ion and Electron Beam System


ETHOS NX5000


www.hitachi-hightech.com/us


.hitachi-hightech.com/us hta-microscopy@hitachi-hightech.com


hta-microscopy@hitachi-hightech.com Tel. 800-253-3053


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