Microscopy Product Vendors TESCAN USA Inc.
Tel: 724-772-7433 Email:
info@tescan-usa.com
www.tescan.com
TESCAN CLARA
APPLICATIONS: Routine study and industrial inspec- tion of metal samples at the nanoscale • Routine imaging of nanoparticles and agglomerates of all kinds • Analysis of beam sensitive and non-conduc- tive materials • Analysis of plants, micro-organisms and other biological specimens • Morphological and elemental characterization of geological samples
FEATURES: Unique In-Beam BSE detector designs allow filtering of signal based on energy and take off angle • Excellent for imaging of beam-sensitive and non-conductive samples • Fast setup of electron beam – optimal
imaging and analytical conditions
guaranteed • UHR Field-free characterization of mate- rials at low beam energies for maximum topography • Intuitive and precise live SEM navigation on the sample at low magnification without the need of opti- cal navigation camera • Intuitive Essence™ software modular platform designed for effortless operation regardless of the user’s skill level
https://www.tescan.com/product/sem-for-materials-science-tescan- clara/
TESCAN SOLARIS
APPLICATIONS: TESCAN SOLARIS is a turn-key FIB-SEM solution for the fabrication of nanostruc- tures
and nanotechnology-inspired microscale
functional devices. TESCAN SOLARIS combines the most precise Focused Ion Beam with UHR-SEM featuring TriLens™ immersion optics, to ensure the best possible connection between ion beam milling and ultra-high-resolution SEM imaging
FEATURES: Best-in-class ion beam performance • Crossover-free ultra-high resolution SEM imaging • High precision nanopatterning engine for elec- tron and ion beams • Multiple gas injection system options with a variety of precursor gases • Cham- ber extension options for up to 12” wafer inspec- tion • Easy-to-use modular software user interface • Python scripting interface for advanced user- defined experiments
https://www.tescan.com/product/fib-sem-for-semiconductors-tescan- solaris/
Companies and their Products
TESCAN AMBER X APPLICATIONS: A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale mate- rials characterization • Optimized plasma FIB-SEM platform for high-quality deprocessing of the most modern semiconductor devices with proprietary chemistries • Milling and polishing of large cross sections • Multiscale, multi-modal FIB-SEM tomog- raphy •
FEATURES: High throughput large area FIB pro- cessing • Ga-free microsample preparation • Field- free ultra high resolution low energy electron beam imaging • In-beam SE and BSE detection • Opti- mized e-beam performance for
multi-modal FIB-SEM tomography • Superior field of view for easy navigation
https://www.tescan.com/product/fib-sem-for-semiconductors-tescan- amber-x/
TESCAN DynaTOM
APPLICATIONS: The world‘s first dedicated dynamic micro-CT for your in-situ experimental needs • Multi-phase fluid flow in porous media • Tensile failure studies of structural alloys and composite materials • Crack propagation and fracture mechan- ics in engineered materials, geological samples and more • Hydration studies in porous materials from geoscience to consumer products • Crystal growth and mineralization in geo materials and construction materials • Plant germination, growth and decay • Freezing, melting and heating cycles in food science applications
FEATURES: Imaging of Delicate Samples • Gan- try-based Design • Continuous Scanning • High Throughput • Unique Software Tools for 4D • Dynamic Screening for Synchrotron Beamtime • Acquila, a modular software architecture for tomo- graphic acquisition and 3D reconstruction
https://www.tescan.com/product/micro-ct-for-materials-science-tescan- dynatom/
high-throughput,
Thermo Fisher Scientific
Email:
info.spectroscopy@thermofisher.com
thermofisher.com/microanalysis
TESCAN AMBER
APPLICATIONS: A field-free UHR-SEM combined with the most precise FIB for sample preparation, sub-surface and 3D analysis capabilities to take your materials nanocharacterization further
FEATURES: Ultra-high resolution field-free SEM imaging and nanoanalysis • The highest precision micro sample preparation • Excellent low-keV ion beam performance • Multi-site FIB process auto- mation • Multimodal FIB-SEM nanotomography • Extended field of view and easy navigation • Easy- to-use modular software interface
https://www.tescan.com/product/fib-sem-for-materials-science-tescan- amber/
Pathfinder Microanalysis Platform APPLICATIONS: • Energy-dispersive X-Ray spec- troscopy
(EDS)
spectroscopy (WDS) • Electron Backscatter Diffrac- tion (EBSD) • Silicon Drift Detectors (SDD) • High throughput, accurate elemental analysis
FEATURES: Pathfinder provides highly accurate EDS & WDS quantification with high sensitivity EBSD for both routine and advanced analysis of the most challenging samples.
• Wavelength-dispersive X-ray
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www.cambridge.org/mto
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