Company Profile NenoVision


NenoVision is a technology company developing and manufacturing a unique atomic force microscope (AFM), LiteScope™, designed for fast and easy integration into scanning electron microscopes (SEMs). Te company is located in Brno, Czech Republic which is a global center of electron microscopy.


NEXT LEVEL OF CORRELATIVE


MICROSCOPY: AFM-in-SEM Te need to analyze and characterize objects from micro to nanoscale is fastly growing. SEM and AFM techniques are the most common with an extensive user pool. Tese are standards in micro-nano characterization and almost the only ones available. In-situ AFM-in-SEM measurement enables to combine advantages of both techniques. It is time-efficient, precise and it provides complex sample analysis while preventing sensitive samples from surface contamination and oxidation.


Besides, NenoVision has developed a unique measurement technique for correlative measurements called CPEM™ (Correlative Probe and Electron Microscopy). CPEM enables you to simultaneously acquire various AFM and SEM signals covering surface topography, mechanical properties, SE, BSE, and other SEM images. Due to the patented technology, all images can be directly correlated with exceptional precision and provide the most powerful correlative imaging on the market.


LITESCOPE IS UNIQUE COMPACT AFM • Plug-and-play integration into SEM • Compact design – compatible with most of the SEM systems • Precise AFM tip navigation to the region of interest by SEM • Self-sensing replaceable probes without optical detection, no laser adjustments • Operates in tilted position (0°–60°; WD ≥ 5 mm) • Works also as a stand-alone AFM


APPLICATION BENEFITS OF AFM-in-SEM • Precise AFM tip navigation using SEM • CPEM correlative imaging – material vs. topography contrast • In-situ 3D topography sub-nm precision and depth profiling • Surface roughness measurement • Electrical properties • Mechanical properties


MAIN APPLICATION AREAS • 1D and 2D materials, 3D nanostructures • FIB and GIS modified surface • Graphene, graphene oxides • Nanowires • Metals


MEMS, NEMS • Semiconductor, failure analyses • Solar cells • Zeolites • Tin films • Quantum dots • Life-Science


www.cambridge.org/mto 19


How to find us


NenoVision Purkyňova 649/127 612 00 Brno Czech Republic Tel: +420 605 287 732 Email:


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