Microscopy Product Vendors Bruker Nano Analytics
Tel: 1-800-234-9729 Email:
info.bna@
bruker.com
www.bruker.com/nano-analysis
Electron Microscope Analyzers
APPLICATIONS: Energy-Dispersive X-ray Spec- trometry (EDS) • Wavelength Dispersive X-ray Spec- trometry (WDS) • Electron Backscatter Diffraction (EBSD) • Micro X-ray Fluorescence (Micro-XRF) on SEM • XFlash® Silicon Drift Detectors (SDD) for SEM and TEM
FEATURES: Bruker Nano Analytic’s electron micro- scope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM offer unmatched comprehensive compositional and structural materials analysis.
www.bruker.com/nano-analysis
Companies and their Products DECTRIS USA Inc.
Phone: +1.215.384.3479
info@dectris.com
www.dectris.com
DECTRIS QUADRO APPLICATIONS: Nanobeam electron
diffraction • 3D precession electron crystallography • Strain
mapping • STEM, 4D-STEM, Ptychography • In-situ imaging
FEATURES: The QUADRO detector is designed to deliver outstanding performances to materials science TEM without compromise on accuracy, speed, or sensitivity. Fully integrated into NanoMegas Topspin.
Bruker Optics
Tel: (978) 439-9899 Email:
info.bopt.us@
bruker.com
www.bruker.com/optics
LUMOS II FTIR Microscope
APPLICATIONS: Polymer Investigation • Surface Analysis
• Particle Analysis • Pharmaceuticals
• Life-Science • Forensics • Electronics • Automo- tive • Environmental
FEATURES: Incredibly fast FTIR imaging, where each pixel is composed of an entire FTIR spectrum. This results in superb spatial resolution and peak sensitivity in all measurement modes. Delivers the best performance in transmission,
reflection and
attenuated total reflection (ATR) measurements. Detect and immediately characterize tiny particles, product defects or tissue anomalies. Easily analyze any sample type of any origin.
www.bruker.com/LUMOS DECTRIS ELA
APPLICATIONS: Electron Energy Loss Spectros- copy • Elemental/chemical mapping • Atomic reso- lution STEM-EELS • Materials characterization
FEATURES: The ELA operates at 9000 spectra/sec in continuous readout mode. Elemental mapping runs in real time and momentum-resolved EELS can be done within minutes.
Deben
Tel: +44 (0) 1359 244 970 & +1 (201) 962 7222 Email:
paulg@deben.co.uk www.deben.co.uk
In-situ testing for microscopy
APPLICATIONS: • Microtest tensile and compres- sion stages • Micro CT tensile, compression and torsion stages • STEM & BSE detectors for SEM • Centaurus scintillator CL and backscattered elec- tron (BSE) detectors • SEM heating and cooling Peltier stages
FEATURES: Deben manufactures in-situ testing stages as well as innovative accessories for SEM, Optical, AFM, XRD and X-ray tomography.
DiATOME U.S.
Tel: 215-412-8390 Email:
info@emsdiasum.com;
stacie@ems-secure.com
www.emsdiasum.com
Cryo Immuno
APPLICATIONS: The first cryo knife with a diamond platform, guarantees the best possible sectioning for sucrose infiltrated samples (Tokuyasu).
FEATURES: The diamond platform guarantees an easy and gentle section pick-up. The sections are collected directly from the diamond surface using a loop and a sucrose/methyl-cellulose droplet.
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www.cambridge.org/mto
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