Company Profile TESCAN USA Inc.
Founded in 1991 by a group of managers and engineers from Tesla with its electron microscopy history starting in the 1950’s, today TESCAN is a globally renowned supplier of Focused Ion Beam workstations, Scanning Electron Microscopes, and 3D X-ray micro-CT systems. TESCAN’s innovative solutions and collaborative nature with its customers have won it a leading position in the world of nano- and microtechnology.
In 2019, TESCAN launched their new Generation 4 series of SEM’s and FIB-SEM’s to the global marketplace. Te state-of-the-art systems provide the most advanced capabilities and quality performance for sample preparation.
TESCAN USA Inc. is the North American arm of TESCAN ORSAY HOLDING, a multinational company established by the merger of Czech company TESCAN, a leading global supplier of SEM’s and Focused Ion Beam workstations, and French company Orsay Physics, a world leader in customized Focused Ion Beam and Electron Beam technology.
SEM, FIB-SEM and micro-CT solutions:
• TESCAN MAGNA – Triglav™ UHR SEM with TriLens™ immersion optics for characterization of nanomaterials
• TESCAN SOLARIS – Triglav™ An ultimate resolution FIB-SEM workbench for advanced nanofabrication applications
• TESCAN SOLARIS X – Triglav™ A Plasma FIB-SEM platform for deep sectioning and the highest resolution end-pointing for package level failure analysis
• TESCAN CLARA – BrightBeam™ Field-free analytical UHR-SEM for materials characterization at the nanoscale
• TESCAN AMBER – BrightBeam™ A field-free UHR-SEM combined with the most precise FIB for sample preparation, sub-surface and 3D analysis capabilities to take your materials nanocharacterization further
• TESCAN AMBER X – BrightBeam™ A unique combination of Plasma FIB and field-free UHR SEM for the widest range of multiscale materials characterization applications
• CoreTOM - a multi-resolution 3D X-ray microscope optimized for high resolution, large field of view imaging of full cores down to microplugs
• DynaTOM - a unique and first of its kind dedicated system for fast dynamic in situ imaging.
• UniTOM XL - enables high-throughput non-destructive 3D imaging for materials research, failure analysis and quality assurance
Te company is focused on research, development and the manufacturing of equipment for the following:
• Scanning electron microscopes and ion beam stations • Ion beam technology • X-ray micro-CT systems • Special vacuum chambers and custom systems • Supplementary accessories for SEM’s • Scientific soſtware compatible with Windows upgrades
How to find us
TESCAN USA Inc. 765 Commonwealth Drive, Suite 101 Warrendale, PA 15086 Tel: 724-772-7433 Email:
info@tescan-usa.com Web address:
www.tescan.com
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www.cambridge.org/mto
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