PRODUCT UPDATE Analysis, test and measurement
Benchtop goniometer Labsphere has introduced a new benchtop goniometer with a footprint of 1.65 x 0.60 x 1.73m for use in small dark rooms and optical laboratories.
The type C set up of this instrument enables developers of single LEDs, LED modules or chips to study angular performance in many development stages with speed and reliability.
The detector head of the goniometer is a high-quality, visible-range spectrometer, equipped with diffuser optics to collect all the important measurement quantities over the customer’s required angular range. Data such as luminous intensity distribution, peak intensity, cone illuminance, beam angle, colour data (x, y/CCT/CRI), spectral power distribution or total luminous flux (lm) is provided in a customisable report.
In addition to the source output
data, ambient temperature during the measurement (IES LM recommendation 79/82) is reported as well as source specific data such as power or power factor.
With a maximum allowable source sample size of 300 x 100mm and 25kg, the new benchtop goniometer covers a wide range of LED measurement requirements.
www.sphereoptics.de
WT1800E power analyser
Yokogawa Europe has launched the WT1800E power analyser, a complete power analysis solution for lighting engineers and designers.
The WT1800E has been designed to measure voltage, current and THD (Using its G5/G6 options) simultaneously. It has six input channels to accommodate three-phase systems and other applications requiring multiple input channels.
Whether analysing multiphase inputs during motor and drive design, or meeting the stringent efficiency standards of photovoltaic inverters, the WT1800E provides the versatility needed to help engineers bring their product concepts successfully to market. Key features of the WT1800E include: guaranteed power accuracy of 0.05 per cent of reading plus 0.05 per cent of range; and being capable of harmonics analysis up to the 500th order of a 50/60 Hz fundamental frequency. The accuracy can be further improved with calibration at Yokogawa’s ISO 17025 accredited lab.
www.yokogawa.com
46 ELECTRO OPTICS l OCTOBER 2016 4D InSpec Surface Gauge
4D Technology has announced the 4D InSpec Surface Gauge, the first handheld, non-contact instrument that measures precision machined surface defects and features with micrometre- level resolution.
The 4D InSpec employs technology which enables rapid measurements that are unaffected by vibration present in most manufacturing environments. For the first time, QA/QC personnel using the gauge can take repeatable precision surface measurements in factory floor, machine shop and field service environments. The 4D InSpec enables direct inspection of large and small components on the shop floor.
FluxGage
Ophir Photonics has announced the FluxGage, a compact luminaire measurement system for measuring the flux, colour, and flicker of LED- based products.
FluxGage is designed for incoming inspection and quality control of new and replacement parts, allowing LED luminaires and modules to be sorted for consistency.
The all-in-one photometric test system uses 2 pi geometry. A spectrometer is incorporated for colour measurement of the spectrum, correlated colour temperature (CCT), colour rendering index (CRI), Duv, and chromaticity. There is also a fast photodetector for flicker measurements. No fibres are needed. The FluxGage uses solar panels as the light detector. The panels are arranged on the inside
Rugged and lightweight, the handheld gauge has a single cable tether to its computer and is designed to handle the rigours of daily use. The system measures surface defects from 2.5 to 2,500μm deep on a wide variety of part geometries.
The 4D InSpec installs in minutes and features a touchscreen interface for setup, operation, analysis and report generation. Its easy-to-use software automatically finds critical features and calculates height, volume, area, slopes and location. Operators can quickly select 2D traces or 3D plots to view feature details.
www.4dtechnology.com
walls of the measurement cavity and are covered with black paint and a dense array of clear pinholes through which the light passes. This design means the instrument is only slightly larger than the luminaire source under test. It can measure luminaires of up to 610 x 450mm. Integrated software simplifies set up and operation with all the optical data from the light source displayed.
www.ophiropt.com
@electrooptics |
www.electrooptics.com
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