June 5 - 10, 2016


Lehigh University, Bethlehem, PA USA MAIN COURSES


SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS June 6-10


SPECIALIZED COURSES


FOCUSED ION BEAM (FIB): Instrumentation and Applications June 6-10


PROBLEM SOLVING: Interpretation and Analysis of SEM/EDS/EBSD Data June 6-10


QUANTITATIVE X-RAY MICROANALYSIS:


Problem Solving using EDS and WDS Techniques June 6-10


SCANNING TRANSMISSION ELECTRON MICROSCOPY: From Fundamentals to Advanced Applications June 6-10


For more information, contact: Sharon Coe | 610.758.5133 | sharon.coe@lehigh.edu


Register and pay in full by April 15 to receive an early bird discount.


www.lehigh.edu/microscopy 46 YEARS OF EXCELLENCE


INTRODUCTION TO SEM AND EDS FOR THE NEW OPERATOR June 5


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